Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films.
Nobumichi Tamura,Alastair A. MacDowell,Ralph Spolenak,B. C. Valek,John C. Bravman,W. L. Brown,Richard Celestre,Howard A. Padmore,B. W. Batterman,J. R. Patel +9 more
TLDR
Scanning X-ray microdiffraction (microSXRD) combines the use of high-brilliance synchrotron sources with the latest achromaticX-ray focusing optics and fast large-area two-dimensional-detector technology to study thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments.Abstract:
Scanning X-ray microdiffraction (µSXRD) combines the use of high-brilliance synchrotron sources with the latest achromatic X-ray focusing optics and fast large-area two-dimensional-detector technology. Using white beams or a combination of white and monochromatic beams, this technique allows for the orientation and strain/stress mapping of polycrystalline thin films with submicrometer spatial resolution. The technique is described in detail as applied to the study of thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments. It is shown that there are significant orientation and strain/stress variations between grains and inside individual grains. A polycrystalline film when investigated at the granular (micrometer) level shows a highly mechanically inhomogeneous medium that allows insight into its mesoscopic properties. If the µSXRD data are averaged over a macroscopic range, results show good agreement with direct macroscopic texture and stress measurements.read more
Citations
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Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction
TL;DR: The components of the macroscopic mechanical stress tensor of a stressed thin film, coating, multilayer or the region near the surface of a bulk material can in principle be determined by X-ray diffraction as discussed by the authors.
Journal ArticleDOI
A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source.
Martin Kunz,Nobumichi Tamura,Kai Chen,Alastair A. MacDowell,Richard Celestre,Matthew M. Church,Sirine C. Fakra,Edward E. Domning,James Glossinger,Jonathan L. Kirschman,Gregory Y. Morrison,D. Plate,Brian V. Smith,Tony Warwick,Valeriy V. Yashchuk,Howard A. Padmore,Ersan Üstündag +16 more
TL;DR: A new facility for microdiffraction strain measurements and microfluorescence mapping has been built at the advanced light source of the Lawrence Berkeley National Laboratory and allows a variety of experiments, which have in common the need of spatial resolution.
Journal ArticleDOI
Visualization of Charge Distribution in a Lithium Battery Electrode
TL;DR: Using synchrotron X-ray microdiffraction, state-of-charge profiles in-plane and normal to the current collector were measured as mentioned in this paper, showing that the portion of a prismatic cell electrode closest to the collector tab had the highest state of charge due to electronic resistance in the composite electrode and supporting foil.
Journal ArticleDOI
Evolution of crack-tip transformation zones in superelastic Nitinol subjected to in situ fatigue: A fracture mechanics and synchrotron X-ray microdiffraction analysis
TL;DR: In this paper, the authors used synchrotron X-ray microdiffraction with fracture mechanics techniques to directly measure in situ three-dimensional strains, phases and crystallographic alignment ahead of a growing fatigue crack (100 cycles in situ ) in superelastic Nitinol.
Visualization of Charge Distribution in a Lithium-Ion Battery Electrode
TL;DR: Using synchrotron X-ray microdiffraction, state-of-charge profiles in-plane and normal to the current collector were measured as discussed by the authors, showing that the portion of a prismatic cell electrode closest to the collector tab had the highest state of charge due to electronic resistance in the composite electrode and supporting foil.
References
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Journal ArticleDOI
High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron X-ray diffraction
Nobumichi Tamura,Alastair A. MacDowell,Richard Celestre,H. A. Padmore,B. C. Valek,John C. Bravman,Ralph Spolenak,W. L. Brown,T. Marieb,H. Fujimoto,B. W. Batterman,J. R. Patel +11 more
TL;DR: In this article, an X-ray synchrotron technique capable of mapping orientation and strain/stress in polycrystalline thin films with submicron spatial resolution is presented.
Journal ArticleDOI
A submicron synchrotron x-ray beam generated by capillary optics
Per Engström,Sture Larsson,Anders Rindby,A. Buttkewitz,S. Garbe,G. Gaul,Arndt Knöchel,F. Lechtenberg +7 more
TL;DR: In this paper, a novel capillary optics technique for focusing synchrotron X-ray beams has been applied in an experiment performed at the DORIS storage ring at HASYLAB.
Journal ArticleDOI
Properties of a submicrometer x‐ray beam at the exit of a waveguide
Werner Jark,Silvia Di Fonzo,Stefano Lagomarsino,Alessia Cedola,Enzo Di Fabrizio,Andreas Bram,Christian Riekel +6 more
TL;DR: In this article, the authors discussed the properties of a 13-keV submicrometer x-ray beam exiting from a waveguide and derived a beam size at the exit which is identical to the guiding layer thickness.
Journal ArticleDOI
Microcrystallography with an X-ray waveguide
Martin Müller,Manfred Burghammer,David Flot,C. Riekel,C. Morawe,Bridget M. Murphy,Alessia Cedola +6 more
TL;DR: In this article, a waveguide microdiffraction setup for an undulator beamline at the European Synchrotron Radiation Facility is described, where a beam size of about 0.1 × 3 µm (vertical × horizontal) at λ = 0.095 nm is obtained.
Journal ArticleDOI
Submicron concentration and confinement of hard X-rays
TL;DR: In this paper, high-intensity hard X-ray beams of submicron diameters were generated using a tapered glass capillary as a concentrator, and a complete description of the fabrication and characterization of such capillary optics is given.
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