Teradyne

About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.

High density printed circuit board

Abstract: A multi-level circuit board for efficiently routing electrical signals is disclosed. The circuit board includes a contact layer comprising a first substrate and formed with a set of contact pads disposed across a relatively large surface area. The contact layer also includes a set of engagement contacts corresponding to the contact pads and arrayed in a densely packed surface area. A plurality of subsequent layers are disposed in fixed stacked relationship to the contact layer. Each subsequent layer includes a subsequent substrate, and a conductive pattern formed on the subsequent substrate and defining a plurality of signal paths. Conductive vias are coupled to the contact pads and the engagement contacts and are formed through the contact layer and one or more of the plurality of subsequent layers. The vias communicate with the respective signal paths and include selected sets of staggered vias configured to optimize the routing of the signal paths along the respective subsequent layers.

Fast and noise-insensitive load status detection

Abstract: Method and apparatus for detecting whether load coils are attached to a telephone line. A stimulus waveform having multiple frequency components is applied to the line. The current and voltage at the near end of the line are coherently sampled and transformed to the frequency domain. The frequency spectra are used to compute auto and cross power spectra of the current and voltage. These power spectra are then used to compute the impedance on the line as well as a coherence function that indicates the extent to which the computed impedance was influenced by noise. If the coherence values indicate that the computed impedance is sufficiently reliable, load coils are detected by finding peaks in the magnitude of the impedance function or sign changes in the phase of the impedance function. Calibration, offset adjustments and ensemble smoothing are used to increase the accuracy of the results. The computation is fast because computing the spectra avoids the needs for individual measurements at multiple frequencies. The computation is accurate because it is not sensitive to noise.

Method and apparatus for qualifying loops for data services

Abstract: A method and automatic test system for determining qualification of a twisted pair transmission line to propagate data signals. The method includes measuring phase imbalance in the twisted pair transmission line. The phase imbalance is determined by resistance imbalance in the twisted pair transmission line. The resistance imbalance is determined by applying a common mode voltage to the twisted pair transmission line; and determining phase imbalance in the twisted pair in response to the applied common mode voltage. The method includes applying a common mode voltage to the twisted pair transmission line; determining phase imbalance in the twisted pair in response to the applied common mode voltage; detecting a peak in the determined phase imbalance; determining a frequency of the detected peak; determining line qualification in accordance with the determined frequency. Methods are provided using series resistive imbalance and phase measurements to discover the type of imbalance existing on a twisted pair transmission line which is unable to support data transmissions. Methods are provided using series resistive imbalance and phase measurements to determine where an imbalance occurs as well as the magnitude of the imbalance.

Relay multiplexing for circuit testers

Abstract: Relay multiplexer circuitry for making a limited number of test channels connectable to a large number of test pins through relays connected to selected test channel nodes and test pin nodes, each test pin node being connectable to a unique combination of test channel nodes within a group of pin nodes, channel nodes and relays.

Processing Storage Devices

Abstract: A storage device processing system that includes at least one automated transporter, at least one rack accessible by the at least one automated transporter, and multiple test slots housed by the at least one rack. Each test slot is configured to receive a storage device for testing. The storage device processing system includes a conveyor arranged in a loop around and being accessible by the at least one automated transporter. The conveyor receives and transports the storage device thereon. The at least one automated transporter is configured to transfer the storage device between the conveyor and one of the test slots of the at least one rack.