Institution
Teradyne
Company•Boston, Massachusetts, United States•
About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.
Topics: Signal, Automatic test equipment, Device under test, Printed circuit board, Interface (computing)
Papers published on a yearly basis
Papers
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15 Mar 2013TL;DR: In this article, an example system may include racks that house slots, in which devices may be stored for testing, and cold air from a cold atrium is drawn over the slots and expelled into a warm atrium.
Abstract: An example system may include racks that house slots, in which devices may be stored for testing. Cold air from a cold atrium is drawn over the slots and expelled into a warm atrium. The resulting warm air is cooled and then recycled back through the slots to control slot temperature.
1 citations
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25 Nov 2015TL;DR: An example process for determining electrical path lengths includes: injecting current into a transmission line having a known capacitance per unit of length, determining a rate of change in voltage on the transmission line in response to the current, and determining an electrical path length of the transmission link based on the determined capacitance of the transmitted line and the known capacity of the line as mentioned in this paper.
Abstract: An example process for determining electrical path lengths includes: injecting current into a transmission line having a known capacitance per unit of length; determining a rate of change in voltage on the transmission line in response to the current; determining a capacitance of the transmission line based on the change in voltage; and determining an electrical path length of the transmission line based on the determined capacitance of the transmission line and the known capacitance per unit of length
1 citations
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01 Nov 2010TL;DR: This paper discusses the planning process and algorithms required to realize an efficient and achievable concurrent test plan for multiple device functions in parallel.
Abstract: Testing multiple device functions in parallel can yield significant test time and cost of test reductions. This paper discusses the planning process and algorithms required to realize an efficient and achievable concurrent test plan.
1 citations
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24 Aug 2000TL;DR: In this paper, the authors present a system for testing middleware of applications in the N-tiered model, which contains test code generators, test engines to execute multiple copies of the test code and a data analyzer to analyze and present the results to a human user.
Abstract: A system for testing middleware of applications in the N-tiered model. The test system contains test code generators, test engines to execute multiple copies of the test code and a data analyzer to analyze and present the results to a human user. The system is able to automatically generate test code to exercise components of the middleware using information about these components that would otherwise be available to the application under test. Multiple copies of the test code are executed in a synchronized fashion. Execution times of multiple events are recorded and then presented in one of several formats. With the system, an application developer can identify components that represent performance bottlenecks or can gather information on deployment properties of individual components that can be used to enhance the performance of the application under test.
1 citations
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01 Oct 2007TL;DR: A Protocol Aware (PA) test system would greatly assist the test engineer in multiple highly leveraged activities but is such a system in fact possible to build?
Abstract: A Protocol Aware (PA) test system would greatly assist the test engineer in multiple highly leveraged activities but is such a system in fact possible to build? One must construct the system so that pins can be grouped by membership in the various protocols on the DUT. Once grouped, local processing must be flexible enough to understand each protocol and respond properly to commands with reasonable latency. Since the supply of new protocols is unlimited, it must be possible to add new protocols at any time. And then, when all this is complete, it must be possible to synchronize operation of the various protocols so that a complete test of the DUT results.
1 citations
Authors
Showing all 830 results
Name | H-index | Papers | Citations |
---|---|---|---|
John H. Lienhard | 68 | 419 | 18058 |
Todd Austin | 55 | 167 | 20607 |
Alexander H. Slocum | 44 | 449 | 9393 |
Scott C. Noble | 30 | 98 | 3495 |
D. R. LaFosse | 26 | 139 | 2555 |
Tongdan Jin | 26 | 113 | 2326 |
Thomas S. Cohen | 24 | 37 | 2490 |
Mark W. Gailus | 21 | 54 | 1851 |
R. Ryan Vallance | 20 | 87 | 1081 |
Richard F. Roth | 18 | 37 | 1104 |
Sepehr Kiani | 15 | 28 | 672 |
Frank W. Ciarallo | 14 | 44 | 1066 |
Brian S. Merrow | 14 | 34 | 621 |
Philip T. Stokoe | 13 | 26 | 1238 |
Ernest P. Walker | 12 | 22 | 252 |