Teradyne

About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.

Site-aware objects

Abstract: A method for use with automatic test equipment (ATE) having sites, each which accommodates a device under test (DUT), includes defining an object for use with the plural sites, where the object is to contain data associated with at least some of the plural sites, and where the object determines which sites are active. The method also includes using the object during testing of DUTs by the ATE.

Rotatable camera module testing system

Abstract: An example system for testing camera modules may include: a polygonal structure that is rotatable, where the polygonal structure includes faces, each of which is configured to receive at least one camera module under test; and targets facing at least some of the faces of the polygonal structure, where each target is usable in testing a corresponding camera module facing the each target.

An introduction to IC testing

Abstract: IC testing has evolved from the patterns established some years ago in the production of semiconductors. Since manual testing cannot meet the complex needs indigenous to IC manufacture, highly sophisticated instruments and test systems have developed that are automatically programmed by computer, tape, or printed-circuit card. This article focuses on many of the problems encountered and techniques employed, and also the requirements imposed on automatic IC testing systems.

4TEL Automated Subscriber Line Test System

Abstract: Powerful computer techniques and sophisticated measurement technology have been applied to local distribution networks by the 4TEL Automated Subscriber Line Test System. It provides PTT's and telephone companies with a total solution to the problems of improving quality of service and reducing costs. The main features of routine testing, line testing, fault location, and special diagnostic testing are discussed together with a description of the technology, system architecture, enhanced features, and the potential for system evolution.

Capacitively coupled re-referencing circuit with transient correction

Abstract: A re-referencing circuit for re-referencing a digital input signal from a first logic environment to a second logic environment includes a non-inverting circuit (210). A capacitive element (C) has a first node coupled to an input (220) of the non-inverting circuit (210) and a second node arranged to receive the digital input signal. A resistive element (214) is coupled between the input and an output of the non-inverting circuit (210). The re-referencing circuit further includes a transient correcting circuit (216) having a first input coupled to a substantially DC level (GND1) of the first logic environment, a second input coupled to a substantially DC level (GND2) of the second logic environment, and an output coupled to the input (220) of the non-inverting circuit (210). The transient correcting circuit (216) applies transient DC differences between the two environments to cancel the effects of transients in the digital input signal.