Teradyne

About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.

Using vibrations to position devices in a test system

Abstract: An example test system includes a tray to hold devices, where the devices include devices to be tested or devices that have been tested; a motor that is controllable to cause vibrations; and a component that couples the motor to the tray to cause the tray to vibrate in response to the vibrations of the motor.

A Net-Centric Instrument Driver Approach for Multi-Computer System Architectures

Abstract: There is a growing interest among system architects to employ multiple computers. Typically, one central computer runs the test executive and user interface, and other computers control the multiple instrument chassis. This architecture produces complexity regarding the location of the instrument driver and associated development and debugging tools. This paper describes the software architecture for a complex digital test instrument that allows the driver and associated tools to be located with the test executive even though the instrument is resident remotely and controlled by another computer.

Testing and characterization of ASICs by the user

Abstract: The use of simulation data obtained during user development of an application-specific IC (ASIC) to generate a test program is discussed. It is shown that the quality of the test program generated in this way depends on the accuracy of the simulation and the thoroughness of the applied stimuli. The simulation needs to take account of both the tester and the device specifications. The tester imposes certain restraints such as minimum pulse width and restrictions on the relative placing of edges. If the simulator is not truly dynamic, there can be problems with the resulting test program in two key areas. The setup and hold times of the inputs may not be correctly verified, and position of the output may be wrongly predicted. A tester-per-pin architecture has several advantages over a shared-resource tester. These advantages mean saving or shortening of certain steps in the conversion process, easy characterization, and faster response for changes. >

Test solution selection using multiple-objective decision models and analyses

Abstract: Designing new automatic test equipment (ATE) frameworks in alignment with the advances in semiconductor technology remains one of the most difficult challenges in the test community. This article presents an elegant methodology for analyzing different models for ATE operation. The methodology ultimately provides a single figure of merit for evaluation and comparison.