Institution
Teradyne
Company•Boston, Massachusetts, United States•
About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.
Topics: Signal, Automatic test equipment, Device under test, Printed circuit board, Interface (computing)
Papers published on a yearly basis
Papers
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26 Jul 2021TL;DR: This paper proposes a practical verification approach that jointly use different window functions, different bandwidth extractions to justify the correct locations and impedance values of the via structures.
Abstract: The time domain reflectometry (TDR) is a very popular tool for high speed link characterizations. However, its modeling and simulations for vias constantly face accuracy challenges due to vias’ small dimensions. While many existing papers discussed discontinuity analysis of transmission lines, in this paper, we focus on the accuracy control methods in TDR modeling and analysis for vias in PCBs for high speed signal integrity (SI). There are many practical factors affecting the via impedance result in TDR, such as frequency domain simulation setups, TDR window selections, discontinuities before and after via structures, etc. Based on the principle analysis, we proposed a practical verification approach that jointly use different window functions, different bandwidth extractions to justify the correct locations and impedance values of the via structures. The proposed method can also be used for other small.
2 citations
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10 Oct 2008TL;DR: In this article, a digital test instrument includes a pattern controller configured to generate a sequence of test patterns, responsive, at least in part, to a pass/fail result, and a pattern memory configured to supply the generated sequence to a unit under test.
Abstract: A digital test instrument and a test method provide adjustable results latency. A digital test instrument includes a pattern controller configured to generate a sequence of test patterns, responsive, at least in part, to a pass/fail result, a pattern memory configured to supply the generated sequence of test patterns to a unit under test, a pattern results collection unit configured to receive at least one result value from the unit under test and to determine a pass/fail result for at least one supplied test pattern, and a synchronization unit configured to provide a no-result indication to the pattern controller during a preset number of pattern cycles following the start of a test, the preset number of pattern cycles based on a results latency of the test instrument, and to provide pass/fail results to the pattern controller after the preset number of pattern cycles.
2 citations
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31 Mar 2005TL;DR: In this paper, a method of calibrating automatic test equipment (ATE) having transmission paths that transport signals includes obtaining amplitude gains of the signals across the transmission paths, obtaining phase delays, and obtaining magnitude and phase offsets associated with the signals based on the amplitude gains and the phase delays.
Abstract: A method of calibrating automatic test equipment (ATE) having transmission paths that transport signals includes obtaining amplitude gains of the signals across the transmission paths, obtaining phase delays of the signals across the transmission paths, obtaining magnitude and phase offsets associated with the signals based on the amplitude gains and the phase delays, and calibrating the ATE using the magnitude and phase offsets.
2 citations
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31 Oct 2008TL;DR: In the past, operational testing has either been too expensive or to complex to offer return on investment sufficient to justify developing a general purpose automatic test system (ATS). as mentioned in this paper proposes a small change in the way one traditionally thinks about tester/TPS development, which opens the door to increased investment in ATS equipment and ATS programs.
Abstract: In the past operational testing has either been too expensive or to complex to offer return on investment sufficient to justify developing a general purpose automatic test system (ATS). A small change in the way one traditionally thinks about tester/TPS development opens the door to increased return on investment in ATS equipment and ATS programs.
2 citations
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04 Aug 19942 citations
Authors
Showing all 830 results
Name | H-index | Papers | Citations |
---|---|---|---|
John H. Lienhard | 68 | 419 | 18058 |
Todd Austin | 55 | 167 | 20607 |
Alexander H. Slocum | 44 | 449 | 9393 |
Scott C. Noble | 30 | 98 | 3495 |
D. R. LaFosse | 26 | 139 | 2555 |
Tongdan Jin | 26 | 113 | 2326 |
Thomas S. Cohen | 24 | 37 | 2490 |
Mark W. Gailus | 21 | 54 | 1851 |
R. Ryan Vallance | 20 | 87 | 1081 |
Richard F. Roth | 18 | 37 | 1104 |
Sepehr Kiani | 15 | 28 | 672 |
Frank W. Ciarallo | 14 | 44 | 1066 |
Brian S. Merrow | 14 | 34 | 621 |
Philip T. Stokoe | 13 | 26 | 1238 |
Ernest P. Walker | 12 | 22 | 252 |