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Institution

Teradyne

CompanyBoston, Massachusetts, United States
About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.


Papers
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Proceedings ArticleDOI
Tao Wang1, Brian Brecht1
26 Jul 2021
TL;DR: This paper proposes a practical verification approach that jointly use different window functions, different bandwidth extractions to justify the correct locations and impedance values of the via structures.
Abstract: The time domain reflectometry (TDR) is a very popular tool for high speed link characterizations. However, its modeling and simulations for vias constantly face accuracy challenges due to vias’ small dimensions. While many existing papers discussed discontinuity analysis of transmission lines, in this paper, we focus on the accuracy control methods in TDR modeling and analysis for vias in PCBs for high speed signal integrity (SI). There are many practical factors affecting the via impedance result in TDR, such as frequency domain simulation setups, TDR window selections, discontinuities before and after via structures, etc. Based on the principle analysis, we proposed a practical verification approach that jointly use different window functions, different bandwidth extractions to justify the correct locations and impedance values of the via structures. The proposed method can also be used for other small.

2 citations

Patent
10 Oct 2008
TL;DR: In this article, a digital test instrument includes a pattern controller configured to generate a sequence of test patterns, responsive, at least in part, to a pass/fail result, and a pattern memory configured to supply the generated sequence to a unit under test.
Abstract: A digital test instrument and a test method provide adjustable results latency. A digital test instrument includes a pattern controller configured to generate a sequence of test patterns, responsive, at least in part, to a pass/fail result, a pattern memory configured to supply the generated sequence of test patterns to a unit under test, a pattern results collection unit configured to receive at least one result value from the unit under test and to determine a pass/fail result for at least one supplied test pattern, and a synchronization unit configured to provide a no-result indication to the pattern controller during a preset number of pattern cycles following the start of a test, the preset number of pattern cycles based on a results latency of the test instrument, and to provide pass/fail results to the pattern controller after the preset number of pattern cycles.

2 citations

Patent
Toshihide Kadota1
31 Mar 2005
TL;DR: In this paper, a method of calibrating automatic test equipment (ATE) having transmission paths that transport signals includes obtaining amplitude gains of the signals across the transmission paths, obtaining phase delays, and obtaining magnitude and phase offsets associated with the signals based on the amplitude gains and the phase delays.
Abstract: A method of calibrating automatic test equipment (ATE) having transmission paths that transport signals includes obtaining amplitude gains of the signals across the transmission paths, obtaining phase delays of the signals across the transmission paths, obtaining magnitude and phase offsets associated with the signals based on the amplitude gains and the phase delays, and calibrating the ATE using the magnitude and phase offsets.

2 citations

Proceedings ArticleDOI
C. Heide1, Robert L. Hoover1
31 Oct 2008
TL;DR: In the past, operational testing has either been too expensive or to complex to offer return on investment sufficient to justify developing a general purpose automatic test system (ATS). as mentioned in this paper proposes a small change in the way one traditionally thinks about tester/TPS development, which opens the door to increased investment in ATS equipment and ATS programs.
Abstract: In the past operational testing has either been too expensive or to complex to offer return on investment sufficient to justify developing a general purpose automatic test system (ATS). A small change in the way one traditionally thinks about tester/TPS development opens the door to increased return on investment in ATS equipment and ATS programs.

2 citations


Authors

Showing all 830 results

NameH-indexPapersCitations
John H. Lienhard6841918058
Todd Austin5516720607
Alexander H. Slocum444499393
Scott C. Noble30983495
D. R. LaFosse261392555
Tongdan Jin261132326
Thomas S. Cohen24372490
Mark W. Gailus21541851
R. Ryan Vallance20871081
Richard F. Roth18371104
Sepehr Kiani1528672
Frank W. Ciarallo14441066
Brian S. Merrow1434621
Philip T. Stokoe13261238
Ernest P. Walker1222252
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20223
20218
202020
201914
201811
201715