Teradyne

About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.

Complete testing of receiver jitter tolerance

Abstract: Devices incorporating high-speed digital receivers must tolerate timing instability. The ability of the receiver to correctly place a receive strobe within the data valid region of a bit fundamentally determines the bit error rate performance for a design or a particular device. The device must meet its performance requirements in the presence of non-ideal timing. Timing irregularities can be introduced from additive non-deterministic noise sources injecting random jitter (Rj); deterministic distortion such as a limited channel bandwidth injecting data dependent jitter (DDj) or circuit oscillations and coupled clocks injecting periodic jitter (Pj).

Clock distribution system for automatic test equipment

Abstract: A clock system for providing a high-speed clock signal to a plurality of integrated circuits is disclosed. The clock system includes an analog signal generator for producing a periodic analog signal of a predetermined frequency and fanout circuitry. The fanout circuitry is coupled to the analog signal generator and includes a transmission line and an RF coupler. The system further includes a plurality of receivers. Each receiver has reference signal input circuitry and clock signal input circuitry. Both the reference signal circuitry and the clock signal circuitry are receptive to coupling locally generated common mode noise. The clock signal circuitry is disposed proximate the RF coupler to provide an RF coupling therebetween.

RIM slot filler module and method of manufacturing the same

Abstract: A slot filler module is presented. The slot filler module includes a RIM molded encapsulant, an insert disposed in a predetermined location within the encapsulant and a connector disposed proximate a first end of the RIM molded encapsulant.

Calibrating non-linear data

Abstract: An example system includes non-transitory machine-readable storage storing calibration data sets. A calibration data set includes parameter values that vary non-linearly. Each of the calibration data sets is temperature-specific. The example system also includes channels over which signals pass to and from units under test (UUTs). A channel includes input circuitry to receive a signal of the signals and to obtain a first parameter based on the signal; and correction circuitry to obtain a second parameter based on the first parameter and based on the calibration data set. The second parameter includes a calibrated version of the first parameter. The calibration data set is selectable based on temperature.