Institution
Teradyne
Company•Boston, Massachusetts, United States•
About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.
Topics: Signal, Automatic test equipment, Device under test, Printed circuit board, Interface (computing)
Papers published on a yearly basis
Papers
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22 May 2003TL;DR: In this paper, a set of cleaning devices is configured to align over the optical interfaces of the set of optical connectors, and direct direct fluid (e.g., gas, gaseous snow, etc.) from the fluid source toward the set OFI, and draw the directed fluid away from the OFI and toward the vacuum source.
Abstract: A system cleans a set of optical connectors. The system includes a fluid source, a vacuum source, a support member which defines a cleaning device edge, and a set of cleaning devices. Each cleaning device includes (i) a fluid intake member which connects to the fluid source, (ii) a fluid output member which connects to the vacuum source, and (iii) a cleaning head which connects to the fluid intake member and the fluid output member. Each cleaning device is disposed along the cleaning device edge of the support member. The set of cleaning devices is configured to (a) align over a set of optical interfaces of the set of optical connectors, (b) direct fluid (e.g., gas, gaseous snow, etc.) from the fluid source toward the set of optical interfaces, and (c) draw the directed fluid away from the set of optical interfaces and toward the vacuum source.
27 citations
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04 Nov 1998TL;DR: In this article, an automatic test system for testing semiconductor devices, particularly memory devices, is presented. But the test system includes a handling device with several temperature controlled chambers, each associated with a test head, and the number of test sites within each chamber is varied in inverse proportion to the time it takes to test a device at the temperature within the chamber.
Abstract: An automatic test system for testing semiconductor devices, particularly memory devices. The test system includes a handling device with several temperature controlled chambers, each associated with a test head. Trays of devices are loaded into the handling device and are brought to thermal equilibrium in each chamber before being tested. The number of test sites within each chamber is varied in inverse proportion to the time it takes to test a device at the temperature within the chamber.
27 citations
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01 Feb 2005TL;DR: In this article, a phase detector is used in a frequency synthesizer to produce signals with low phase noise and accurate phase control, which can further be used to as building blocks in ATE systems and other electronic systems for generating low jitter clocks and waveforms.
Abstract: A high performance phase detector includes a local digital oscillator for generating a digital reference signal of programmable frequency and phase. The phase detector accumulates a difference in phase between the digital reference signal and a sampled input signal to produce a measure of phase error. The phase detector can be advantageously used in a frequency synthesizer to produce signals with low phase noise and accurate phase control. Synthesizers of this type can further be used to as building blocks in ATE systems and other electronic systems for generating low jitter clocks and waveforms.
27 citations
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17 Apr 2008TL;DR: A disk drive testing system as discussed by the authors includes one or more test racks and test slots, each test slot being configured to receive and support disk drive transporter carrying a disk drive for testing, and also includes a transfer station for supplying disk drives to be tested.
Abstract: A disk drive testing system includes one or more test racks, and one or more test slots housed by the one or more test racks, each test slot being configured to receive and support a disk drive transporter carrying a disk drive for testing. The disk drive testing system also includes a transfer station for supplying disk drives to be tested. The one or more test racks and the transfer station at least partially define an operating area. The disk drive testing system can also include automated machinery that is disposed within the operating area and is configured to transfer disk drives between the transfer station and the one or more test slots, and a cover at least partially enclosing the operating area, thereby at least partially inhibiting air exchange between the operating area and an environment surrounding the test racks.
27 citations
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09 Sep 1988TL;DR: In this article, a card cage has slots for removably receiving circuit boards, and a plurality of circuit boards in the slots, at least one circuit board being a high-frequency board carrying an enclosure containing a highfrequency device.
Abstract: Electrical circuitry support apparatus including a card cage having slots for removably receiving circuit boards, and a plurality of circuit boards in the slots, at least one circuit board being a high-frequency board carrying an enclosure containing a high-frequency device. The enclosure provides shielding inhibiting transmission of high-frequency signals to or from the device.
26 citations
Authors
Showing all 830 results
Name | H-index | Papers | Citations |
---|---|---|---|
John H. Lienhard | 68 | 419 | 18058 |
Todd Austin | 55 | 167 | 20607 |
Alexander H. Slocum | 44 | 449 | 9393 |
Scott C. Noble | 30 | 98 | 3495 |
D. R. LaFosse | 26 | 139 | 2555 |
Tongdan Jin | 26 | 113 | 2326 |
Thomas S. Cohen | 24 | 37 | 2490 |
Mark W. Gailus | 21 | 54 | 1851 |
R. Ryan Vallance | 20 | 87 | 1081 |
Richard F. Roth | 18 | 37 | 1104 |
Sepehr Kiani | 15 | 28 | 672 |
Frank W. Ciarallo | 14 | 44 | 1066 |
Brian S. Merrow | 14 | 34 | 621 |
Philip T. Stokoe | 13 | 26 | 1238 |
Ernest P. Walker | 12 | 22 | 252 |