Teradyne

About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.

Programmable differential d flip-flop

Abstract: A differential D flip-flop is disclosed including respective master and slave cells. The master cell comprises a first data set circuit and a first data store circuit. The first data store circuit couples to the output of the first data set circuit. The cell further includes a differential clock circuit and a first current source for generating a fixed bias current in the master cell. The clock circuit having complementary clock inputs to alternatingly set and store data in the data set and data store circuits. The slave cell includes a second differential input coupled to the first differential output of the master cell. The slave cell further includes a second current source for generating a second bias current, the second current source having programmable inputs for varying the slave cell bias current, thereby controlling the delay of the flip-flop.

Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head

Abstract: An apparatus and method are provided for the automatic operation of a manipulator to move a test head or peripheral into position for proper alignment and docking of the test head with the peripheral. Examples of peripherals include a handler and a prober. Sensors are provided to obtain relative positional information of the test head in the relation to the peripheral, allowing a controller to issue instructions to the manipulator to correct differences in each of the six degrees of freedom between the mating surfaces of the test head and the manipulator.

Method and apparatus for 0/180 degree phase detector

Abstract: An embodiment of the present invention provides a system for detecting a phase-shifted signal at high frequencies in data and clock recovery circuitry. An up-pulse generator, in one embodiment, provides output pulses having a duration exceeding the duration of input pulses upon detection of a phase-shifted signal leading the reference signal. A down-pulse generator provides output pulses having a duration exceeding the duration of input pulses upon detection of a phase-shifted signal lagging the reference signal.

Conductive temperature control

Abstract: A test system includes a transporter having test sockets, where each test socket is configured to receive a device to be tested by the test system, and each test socket includes an element that is controllable to change a temperature of a device in the test socket through thermal conduction. The test system includes a test rack comprising slots. The transporter is configured for movement into, and out of, a slot of the test rack to test devices in the test sockets.

Pin electronics with high voltage functionality

Abstract: In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a second voltage measured at the output. The IC may include a first amplifier having an input connected to a voltage source. The IC may also include a second amplifier having an input connected to the output of the PE driver.