Institution
Teradyne
Company•Boston, Massachusetts, United States•
About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.
Topics: Signal, Automatic test equipment, Device under test, Printed circuit board, Interface (computing)
Papers published on a yearly basis
Papers
More filters
•
03 Dec 2001TL;DR: In this paper, a time distortion circuit and a selector are interposed between the receiver and the transmitter for testing the serial port, where the selector selects between a receiver and a direct input, which provides an algorithmic test signal.
Abstract: An instrument for economically yet thoroughly testing serial ports employs a receiver and a transmitter. The receiver can be coupled to a TX line of a serial port for receiving a serial bit stream. The transmitter can be coupled to an RX line of the serial port for generating a serial bit stream. The receiver is coupled to the transmitter for establishing a loopback connection between the TX and RX lines of the serial port. A time distortion circuit and a selector are interposed between the receiver and the transmitter. The time distortion circuit adds predetermined amounts of timing distortion for testing the serial port. The selector selects between the receiver and a direct input, which provides an algorithmic test signal. The algorithmic test signal differs from the input serial bit stream received by the receiver to allow the TX and RX lines to be independently tested.
31 citations
•
22 Feb 1978TL;DR: In this article, the authors present an approach for measuring voltage drop due to test currents flowing along a conductor to an IC mounted on a circuit board, comprising a probe having at least two contact tips mounted on the conductor, the tips being spaced apart sufficiently to permit measurement of electrical activity in a segment of the conductor between the tips.
Abstract: Apparatus for analyzing electrical circuit boards by measuring the voltage drop due test currents flowing along a conductor to an IC mounted on a circuit board, comprising a probe having at least two contact tips mounted to simultaneously contact at least two points on the conductor, the tips being spaced apart sufficiently to permit measurement of electrical activity in a segment of the conductor between the tips, and means for injecting a test signal directly into the conductor via the probe, improved in that there are provided means for measuring a first voltage drop across a segment produced by the flow of test current through the segment away from the IC and a second voltage drop across a segment produced by the flow of test current through the segment into the IC, and means for determining the ratio R 1 /R 2 , where R 1 is the internal resistance of the IC and R 2 is the parallel resistance of all other ICs on the same node.
31 citations
•
17 Jun 1974TL;DR: In this paper, the shank of the contact is split, which forms two branches that provide a resiliently acting interference fit within a contact-mounting aperture, and a heat sink, preferably employed in a socket with the contact and nested within the profile of a contact spring section, has a heat receiving panel for abutting against the underside of the mounted circuit device.
Abstract: Electrical socket apparatus for integrated circuit packages and like devices has a contact for receiving the male connection element of the circuit device through an aperture in a folded spring section and for seating the male element at the mouth of the folded section. The shank of the contact is split, which forms two branches that provide a resiliently-acting interference fit of the shank within a contact-mounting aperture. A heat sink, preferably employed in a socket with the contact and nested within the profile of the contact spring section, has a heat receiving panel for abutting against the underside of the mounted circuit device.
31 citations
••
27 Sep 2010
TL;DR: This paper examines a commercial engineering company's use of traceability and the reasons why traceability is providing value despite the many challenges it presents, and describes the solution that was deployed and analyzes what has and has not succeeded.
Abstract: Within the world of requirements engineering, it seems a foregone conclusion that traceability is vital to the product development process. Simultaneously, it appears that any implementation of traceability is doomed to failure. This paper examines a commercial engineering company's use of traceability and the reasons why traceability is providing value despite the many challenges it presents. It describes the solution that was deployed and analyzes what has and has not succeeded, factors which should be common to any organization attempting to use requirements traceability.
31 citations
•
18 Dec 2002TL;DR: In this paper, a pin electronics circuit for use in automatic test equipment is described. Butler et al. describe a pin driver having an output adapted for coupling to a device under-test pin, and a first input.
Abstract: A pin electronics circuit for use in automatic test equipment is disclosed. The pin electronics circuit includes a pin driver having an output adapted for coupling to a device-under-test pin, and a first input. AC input circuitry couples to a pattern generator to receive pattern test signals while DC input circuitry connects to a DC parametric controller. Selector circuitry selectively couples the AC and DC input circuitry to the pin driver first input.
31 citations
Authors
Showing all 830 results
Name | H-index | Papers | Citations |
---|---|---|---|
John H. Lienhard | 68 | 419 | 18058 |
Todd Austin | 55 | 167 | 20607 |
Alexander H. Slocum | 44 | 449 | 9393 |
Scott C. Noble | 30 | 98 | 3495 |
D. R. LaFosse | 26 | 139 | 2555 |
Tongdan Jin | 26 | 113 | 2326 |
Thomas S. Cohen | 24 | 37 | 2490 |
Mark W. Gailus | 21 | 54 | 1851 |
R. Ryan Vallance | 20 | 87 | 1081 |
Richard F. Roth | 18 | 37 | 1104 |
Sepehr Kiani | 15 | 28 | 672 |
Frank W. Ciarallo | 14 | 44 | 1066 |
Brian S. Merrow | 14 | 34 | 621 |
Philip T. Stokoe | 13 | 26 | 1238 |
Ernest P. Walker | 12 | 22 | 252 |