Teradyne

About: Teradyne is a company organization based out in Boston, Massachusetts, United States. It is known for research contribution in the topics: Signal & Automatic test equipment. The organization has 828 authors who have published 999 publications receiving 15695 citations.

Using a parametric measurement unit for converter testing

Abstract: In one aspect, the invention is an integrated circuit (IC) for use in testing an analog-to-digital (ADC) converter includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the ADC. The IC also includes a first digital-to-analog converter (DAC) connected to the first channel of the PMU. The DAC has a DC level of accuracy of less than 1 millivolt.In another aspect, the invention is an integrated circuit (IC) for use in testing a digital-to-analog-converter-device-under-test (DACDUT). The IC includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the DACDUT and including an output port for taking measurements, a first digital-to-analog converter (DAC) connected to the first channel of the PMU and a PMU measurement path connected to the output port having a DC level of accuracy of less than 1 mV.

Circuit for improved test and calibration in automated test equipment

Abstract: In at least one embodiment, a circuit for a multi-channel tester having a central resource, a plurality of outputs, and a switching matrix coupling the central resource to the plurality of outputs via a plurality of selectable channels. Each of the selectable channels having PIN diodes coupled in a half-bridge configuration. A first, a second, and a third biasing source for forward biasing the PIN diodes. The first and second biasing sources are coupled to a central resource coupled end and an output coupled end of the half-bridge, respectively. The third biasing source is coupled to a common node. The first and second biasing sources are constructed to provide substantially balanced outputs and such that the sum of the ouputs of the first and second biasing sources are substantially balanced with respect to the output of the third bias source. In some embodiments, the plurality of selectable channels comprises the same first biasing source. In some embodiments, each of the plurality of channels comprises a different second biasing source. In some embodiments, pin electronics drivers can be used as the second biasing source. In some embodiments, a single third biasing source can be coupled to each of the common nodes of the plurality of selectable channels via one of a plurality of switches. In some embodiments, the PIN diodes can be located near the central resource end of the channel and near the output pin end of the channel allowing cleaner and more accurate voltage/timing measurements.

A method for test system diagnostics based on the principles of artificial intelligence

Abstract: As VLSI test systems grow more complex, system maintenance becomes an increasing problem. The application of artificial intelligence to test system diagnostics provides the system with the ability to identify the causes of malfunction with speed and accuracy. This automated process has the potential for simplifying system maintenance. The application of the principles of artificial intelligence to test system diagnostics, and the status of this work and its future directions are described.

Electrical connector assembly with mounting hardware and protective cover

Abstract: An electrical connector assembly used with a daughter board and a back plane that protects the daughter board and the electrical connectors from damage during use The assembly includes mounting hardware that is attached to the daughter board to prevent it from bending when a high insertion force is used to plug the daughter board onto the back plane The mounting hardware also prevents the electrical connectors from damage by distributing the insertion force evenly across the connectors The assembly also includes a protective cover that is attached to the electrical connectors The protective cover encloses the signal contacts of the electrical connectors that are attached to the daughter board, and swings away automatically to expose the signal contacts when the daughter board is plugged onto the back plane