Journal ArticleDOI
Modeling of nonlinear thermal resistance in FinFETs
Bala Krishna Kompala,Pragya Kushwaha,Harshit Agarwal,Sourabh Khandelwal,Juan Pablo Duarte,Chenming Hu,Yogesh Singh Chauhan +6 more
TLDR
In this paper, the authors investigated the thermal resistance of FinFETs with the variation in the number of fin, shape of fin and fin pitch, and proposed a model for thermal resistance behavior correctly with N fin and F pitch variation.Abstract:
In this paper, self-consistent three-dimensional (3D) device simulations for exact analysis of thermal transport in FinFETs are performed. We analyze the temperature rise in FinFET devices with the variation in the number of fins (N fin), shape of fins and fin pitch (F pitch). We investigate that the thermal resistance R th has nonlinear dependency on N fin and F pitch. We formulate a model for thermal resistance behavior correctly with N fin and F pitch variation. The proposed formulation is implemented in industry standard Berkeley short-channel independent gate FET model for common multi-gate transistors (BSIM-CMG) and validated with both experimental data and TCAD simulations.read more
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Journal ArticleDOI
Modeling of Effective Thermal Resistance in Sub-14-nm Stacked Nanowire and FinFETs
TL;DR: In this article, a new model for thermal resistance estimation in fin-shaped field effect transistors (FinFETs) and stacked-nanowire FETs was proposed.
Journal ArticleDOI
Synthesis and characterization of Ca doped ZnO thin films by sol–gel method
Anca-Ionela Istrate,F. Nastase,Iuliana Mihalache,Florin Comanescu,Raluca Gavrila,Oana Tutunaru,Cosmin Romanitan,Vasilica Tucureanu,Monica Nedelcu,Raluca Muller +9 more
TL;DR: In this article, the structural changes in the molecular binding between ZnO and Ca, Fourier Transform Infrared spectroscopy (FTIR), Micro-Raman Spectroscopy and X-ray diffraction (XRD) were performed.
Journal ArticleDOI
An Insight Into Self-Heating Effects and Its Implications on Hot Carrier Degradation for Silicon-Nanotube-Based Double Gate-All-Around (DGAA) MOSFETs
TL;DR: In this article, 3-dimensional (3-D) electrothermal simulations using coupled hydrodynamic and thermodynamic transport models are performed to analyze the electrothermodynamic behavior and self-heating effects in ultra-thin DGAA MOSFETs.
Journal ArticleDOI
Impact of self-heating effect on the performance of hybrid FinFET
TL;DR: The impact of self-heating effect (SHE) in hybrid FinFET, which is a promising device for high-performance applications, is presented and the linear dependence of thermal resistance (Rth) on Lg, Wfin, and tbox; and nonlinear dependence on Lpitch and N is studied.
Journal ArticleDOI
Investigation of Electrothermal Behaviors of 5-nm Bulk FinFET
TL;DR: In this article, the authors analyzed the localized thermal effect caused by self-heating effect (SE) in 5-nm bulk FinFETs that are scaled down, following the International Technology Roadmap for Semiconductors.