P
Peter Bøggild
Researcher at Technical University of Denmark
Publications - 261
Citations - 10255
Peter Bøggild is an academic researcher from Technical University of Denmark. The author has contributed to research in topics: Graphene & Carbon nanotube. The author has an hindex of 49, co-authored 250 publications receiving 8837 citations. Previous affiliations of Peter Bøggild include Nielsen Holdings N.V. & University of Copenhagen.
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Journal ArticleDOI
Science and technology roadmap for graphene, related two-dimensional crystals, and hybrid systems
Andrea C. Ferrari,Francesco Bonaccorso,Francesco Bonaccorso,Vladimir I. Fal'ko,Konstantin S. Novoselov,Stephan Roche,Peter Bøggild,Stefano Borini,Frank H. L. Koppens,Vincenzo Palermo,Nicola M. Pugno,Nicola M. Pugno,Nicola M. Pugno,Jose A. Garrido,Roman Sordan,Alberto Bianco,Laura Ballerini,Maurizio Prato,Elefterios Lidorikis,Jani Kivioja,Claudio Marinelli,Tapani Ryhänen,Alberto F. Morpurgo,Jonathan N. Coleman,Valeria Nicolosi,Luigi Colombo,Albert Fert,Albert Fert,Mar García-Hernández,Adrian Bachtold,Grégory F. Schneider,Francisco Guinea,Cees Dekker,Matteo Barbone,Zhipei Sun,Costas Galiotis,Alexander N. Grigorenko,Gerasimos Konstantatos,Andras Kis,Mikhail I. Katsnelson,Lieven M. K. Vandersypen,A. Loiseau,Vittorio Morandi,Daniel Neumaier,Emanuele Treossi,Vittorio Pellegrini,Vittorio Pellegrini,Marco Polini,Alessandro Tredicucci,Gareth M. Williams,Byung Hee Hong,Jong Hyun Ahn,Jong Min Kim,Herbert Zirath,Bart J. van Wees,Herre S. J. van der Zant,Luigi Occhipinti,Andrea di Matteo,Ian A. Kinloch,Thomas Seyller,Etienne Quesnel,Xinliang Feng,K.B.K. Teo,Nalin Rupesinghe,Pertti Hakonen,Simon R. T. Neil,Quentin Tannock,Tomas Löfwander,Jari M. Kinaret +68 more
TL;DR: An overview of the key aspects of graphene and related materials, ranging from fundamental research challenges to a variety of applications in a large number of sectors, highlighting the steps necessary to take GRMs from a state of raw potential to a point where they might revolutionize multiple industries are provided.
Journal ArticleDOI
The hot pick-up technique for batch assembly of van der Waals heterostructures
Filippo Pizzocchero,Lauge Gammelgaard,Bjarke Sørensen Jessen,José M. Caridad,Lei Wang,James Hone,Peter Bøggild,Timothy J. Booth +7 more
TL;DR: The presented method readily lends itself to fabrication of van der Waals heterostructures in both ambient and controlled atmospheres, while the ability to assemble pre-patterned layers paves the way for complex three-dimensional architectures.
Production and processing of graphene and related materials
Claudia Backes,Claudia Backes,Amr M. Abdelkader,Concepción Alonso,Amandine Andrieux-Ledier,Raul Arenal,Raul Arenal,Jon Azpeitia,Nilanthy Balakrishnan,Luca Banszerus,Julien Barjon,Ruben Bartali,Sebastiano Bellani,Claire Berger,Claire Berger,Reinhard Berger,M.M. Bernal Ortega,Carlo Bernard,Peter H. Beton,André Beyer,Alberto Bianco,Peter Bøggild,Francesco Bonaccorso,Gabriela Borin Barin,Cristina Botas,Rebeca A. Bueno,Daniel Carriazo,Andres Castellanos-Gomez,Meganne Christian,Artur Ciesielski,Tymoteusz Ciuk,Matthew T. Cole,Jonathan N. Coleman,Camilla Coletti,Luigi Crema,Huanyao Cun,Daniela Dasler,Domenico De Fazio,Noel Díez,Simon Drieschner,Georg S. Duesberg,Roman Fasel,Roman Fasel,Xinliang Feng,Alberto Fina,Stiven Forti,Costas Galiotis,Costas Galiotis,Giovanni Garberoglio,Jorge M. Garcia,Jose A. Garrido,Marco Gibertini,Armin Gölzhäuser,Julio Gómez,Thomas Greber,Frank Hauke,Adrian Hemmi,Irene Hernández-Rodríguez,Andreas Hirsch,Stephen A. Hodge,Yves Huttel,Peter Uhd Jepsen,I. Jimenez,Ute Kaiser,Tommi Kaplas,HoKwon Kim,Andras Kis,Konstantinos Papagelis,Konstantinos Papagelis,Kostas Kostarelos,Aleksandra Krajewska,Kangho Lee,Changfeng Li,Harri Lipsanen,Andrea Liscio,Martin R. Lohe,Annick Loiseau,Lucia Lombardi,María Francisca López,Oliver Martin,Cristina Martín,Lidia Martínez,José A. Martín-Gago,José I. Martínez,Nicola Marzari,Alvaro Mayoral,Alvaro Mayoral,John B. McManus,Manuela Melucci,Javier Méndez,Cesar Merino,Pablo Merino,Andreas Meyer,Elisa Miniussi,Vaidotas Miseikis,Neeraj Mishra,Vittorio Morandi,Carmen Munuera,Roberto Muñoz,Hugo Nolan,Luca Ortolani,A. K. Ott,A. K. Ott,Irene Palacio,Vincenzo Palermo,John Parthenios,Iwona Pasternak,Amalia Patanè,Maurizio Prato,Maurizio Prato,Henri Prevost,Vladimir Prudkovskiy,Nicola M. Pugno,Nicola M. Pugno,Nicola M. Pugno,Teófilo Rojo,Antonio Rossi,Pascal Ruffieux,Paolo Samorì,Léonard Schué,Eki J. Setijadi,Thomas Seyller,Giorgio Speranza,Christoph Stampfer,I. Stenger,Wlodek Strupinski,Yuri Svirko,Simone Taioli,Simone Taioli,Kenneth B. K. Teo,Matteo Testi,Flavia Tomarchio,Mauro Tortello,Emanuele Treossi,Andrey Turchanin,Ester Vázquez,Elvira Villaro,Patrick Rebsdorf Whelan,Zhenyuan Xia,Rositza Yakimova,Sheng Yang,G. Reza Yazdi,Chanyoung Yim,Duhee Yoon,Xianghui Zhang,Xiaodong Zhuang,Luigi Colombo,Andrea C. Ferrari,Mar García-Hernández +148 more
TL;DR: In this article, the authors present an overview of the main techniques for production and processing of graphene and related materials (GRMs), as well as the key characterization procedures, adopting a 'hands-on' approach, providing practical details and procedures as derived from literature and from the authors' experience, in order to enable the reader to reproduce the results.
Journal ArticleDOI
Dielectrophoresis of carbon nanotubes using microelectrodes: a numerical study
Maria Dimaki,Peter Bøggild +1 more
TL;DR: In this article, the authors present numerical calculations of carbon nanotubes subjected to dielectrophoresis, drag force and Brownian motion induced by application of an ac voltage to a set of microelectrodes in a microliquid channel.
Journal ArticleDOI
Graphene Conductance Uniformity Mapping
Jonas Christian Due Buron,Dirch Hjorth Petersen,Peter Bøggild,David G. Cooke,Michael Hilke,Jie Sun,Eric Whiteway,Peter Folmer Nielsen,Ole Hansen,August Yurgens,Peter Uhd Jepsen +10 more
TL;DR: The combination of M4PP and THz-TDS conductance measurements reveals that the film is electrically continuous on the nanoscopic scale with microscopic defects likely originating from the transfer process, dominating the microscale conductance of the investigated graphene film.