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Institution

United States Department of Energy

GovernmentWashington D.C., District of Columbia, United States
About: United States Department of Energy is a government organization based out in Washington D.C., District of Columbia, United States. It is known for research contribution in the topics: Catalysis & Coal. The organization has 13656 authors who have published 14177 publications receiving 556962 citations. The organization is also known as: DOE & Department of Energy.
Topics: Catalysis, Coal, Combustion, Adsorption, Hydrogen


Papers
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Journal ArticleDOI
TL;DR: A detailed description of the United States Department of Energy (US-DOE) methodology for estimating CO 2 storage potential for oil and gas reservoirs, saline formations, and unmineable coal seams is provided in this article.

215 citations

Journal ArticleDOI
TL;DR: In this paper, the authors provide a critical review of the observations (laboratory and field), the mechanisms behind those observations, and the models to mimic the imbibition behavior of shales.

214 citations

Journal ArticleDOI
TL;DR: In this article, a simple and direct measurement of the rate of the shuttling of polysulfide ions between the electrodes in a lithium-sulfur battery is reported.
Abstract: The shuttling of polysulfide ions between the electrodes in a lithium-sulfur battery is a major technical issue limiting the self-discharge and cycle life of this high-energy rechargeable battery. Although there have been attempts to suppress the shuttling process, there has not been a direct measurement of the rate of shuttling. We report here a simple and direct measurement of the rate of the shuttling (that we term “shuttle current”), applicable to the study of any type of lithium-sulfur cell. We demonstrate the effectiveness of this measurement technique using cells with and without lithium nitrate (a widely-used shuttle suppressor additive). We present a phenomenological analysis of the shuttling process and simulate the shuttle currents as a function of the state-of-charge of a cell. We also demonstrate how the rate of decay of the shuttle current can be used to predict the capacity fade in a lithium-sulfur cell due to the shuttle process. As a result, we expect that this new ability to directly measure shuttle currents will provide greater insight into the performance differences observed with various additives and electrode modifications that are aimed at suppressing the rate of shuttling of polysulfide ions and increasing the cycle life of lithium-sulfur cells.

214 citations

Journal ArticleDOI
TL;DR: In this paper, the relationship between the sufficient number of degrees of freedom describing fluid flow and the bound on the fractal dimension of the Navier-Stokes attractor was investigated.
Abstract: Research on the abstract properties of the Navier–Stokes equations in three dimensions has cast a new light on the time-asymptotic approximate solutions of those equations. Here heuristic arguments, based on the rigorous results of that research, are used to show the intimate relationship between the sufficient number of degrees of freedom describing fluid flow and the bound on the fractal dimension of the Navier–Stokes attractor. In particular it is demonstrated how the conventional estimate of the number of degrees of freedom, based on purely physical and dimensional arguments, can be obtained from the properties of the Navier–Stokes equation. Also the Reynolds-number dependence of the sufficient number of degrees of freedom and of the dimension of the attractor in function space is elucidated.

213 citations

Patent
17 Nov 1994
TL;DR: In this paper, a pattern of flat-topped silicon dioxide islands 19 protrude less than 5 micrometers from the otherwise flat surface of an electrostatic chuck face and contain a low pressure helium thermal contact gas used to assist heat removal during plasma etching of a silicon wafer held by the chuck.
Abstract: An electrostatic chuck is faced with a patterned silicon plate 11, createdy micromachining a silicon wafer, which is attached to a metallic base plate 13. Direct electrical contact between the chuck face 15 (patterned silicon plate's surface) and the silicon wafer 17 it is intended to hold is prevented by a pattern of flat-topped silicon dioxide islands 19 that protrude less than 5 micrometers from the otherwise flat surface of the chuck face 15. The islands 19 may be formed in any shape. Islands may be about 10 micrometers in diameter or width and spaced about 100 micrometers apart. One or more concentric rings formed around the periphery of the area between the chuck face 15 and wafer 17 contain a low-pressure helium thermal-contact gas used to assist heat removal during plasma etching of a silicon wafer held by the chuck. The islands 19 are tall enough and close enough together to prevent silicon-to-silicon electrical contact in the space between the islands, and the islands occupy only a small fraction of the total area of the chuck face 15, typically 0.5 to 5 percent. The pattern of the islands 19, together with at least one hole 12 bored through the silicon veneer into the base plate, will provide sufficient gas-flow space to allow the distribution of the helium thermal-contact gas.

213 citations


Authors

Showing all 13660 results

NameH-indexPapersCitations
Martin White1962038232387
Paul G. Richardson1831533155912
Jie Zhang1784857221720
Krzysztof Matyjaszewski1691431128585
Yang Gao1682047146301
David Eisenberg156697112460
Marvin Johnson1491827119520
Carlos Escobar148118495346
Joshua A. Frieman144609109562
Paul Jackson141137293464
Greg Landsberg1411709109814
J. Conway1401692105213
Pushpalatha C Bhat1391587105044
Julian Borrill139387102906
Cecilia Elena Gerber1381727106984
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20233
202223
2021633
2020601
2019654
2018598