Institution
National Physical Laboratory
Facility•London, United Kingdom•
About: National Physical Laboratory is a facility organization based out in London, United Kingdom. It is known for research contribution in the topics: Dielectric & Thin film. The organization has 7615 authors who have published 13327 publications receiving 319381 citations.
Papers published on a yearly basis
Papers
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TL;DR: In this paper, the authors present an overview on the various aspects of device development i.e. from synthesis of high ZT thermoelectric materials to issues & design aspects of the TEG.
224 citations
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TL;DR: It is shown that the microstructural heterogeneities lead to non-uniform Li insertion and current distribution while graded-microstructures improve the performance.
Abstract: Driving range and fast charge capability of electric vehicles are heavily dependent on the 3D microstructure of lithium-ion batteries (LiBs) and substantial fundamental research is required to optimise electrode design for specific operating conditions. Here we have developed a full microstructure-resolved 3D model using a novel X-ray nano-computed tomography (CT) dual-scan superimposition technique that captures features of the carbon-binder domain. This elucidates how LiB performance is markedly affected by microstructural heterogeneities, particularly under high rate conditions. The elongated shape and wide size distribution of the active particles not only affect the lithium-ion transport but also lead to a heterogeneous current distribution and non-uniform lithiation between particles and along the through-thickness direction. Building on these insights, we propose and compare potential graded-microstructure designs for next-generation battery electrodes. To guide manufacturing of electrode architectures, in-situ X-ray CT is shown to reliably reveal the porosity and tortuosity changes with incremental calendering steps.
223 citations
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TL;DR: This paper shows that a Monte Carlo method is an effective and versatile tool for determining the PDF for the measurands and provides guidance on optimizing the approach, identifies some pitfalls and indicates means for validating the results.
Abstract: The Guide to the Expression of Uncertainty in Measurement (GUM) is the internationally accepted master document for the evaluation of uncertainty. It contains a procedure that is suitable for many, but not all, uncertainty evaluation problems met in practice. This procedure constitutes an approximation to the general solution of the Markov formula, which infers the probability density function (PDF) for the output quantities (measurands) from the model of the measurement and the PDFs for the input quantities. This paper shows that a Monte Carlo method is an effective and versatile tool for determining the PDF for the measurands. This method provides a consistent Bayesian approach to the evaluation of uncertainty. Although in principle straightforward, some care is required in representing and validating the results obtained using the method. The paper provides guidance on optimizing the approach, identifies some pitfalls and indicates means for validating the results.
222 citations
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TL;DR: In this article, the role of surfaces at the micrometric and nanometric length scales is discussed and applications, functional behaviour, and manufacturing issues are reviewed with respect to state-of-the-art and emerging products fabricated using high precision technologies.
221 citations
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TL;DR: In this article, the authors review their experience of TLS sampling strategies from 27 campaigns conducted over the past 5 years, across tropical and temperate forest plots, where data was captured with a RIEGL VZ-400 laser scanner.
220 citations
Authors
Showing all 7655 results
Name | H-index | Papers | Citations |
---|---|---|---|
Rajesh Kumar | 149 | 4439 | 140830 |
Akhilesh Pandey | 100 | 529 | 53741 |
A. S. Bell | 90 | 305 | 61177 |
David R. Clarke | 90 | 553 | 36039 |
Praveen Kumar | 88 | 1339 | 35718 |
Richard C. Thompson | 87 | 380 | 45702 |
Xin-She Yang | 85 | 444 | 61136 |
Andrew J. Pollard | 79 | 673 | 26295 |
Krishnendu Chakrabarty | 79 | 996 | 27583 |
Vinod Kumar | 77 | 815 | 26882 |
Bansi D. Malhotra | 75 | 375 | 19419 |
Matthew Hall | 75 | 827 | 24352 |
Sanjay K. Srivastava | 73 | 366 | 15587 |
Michael Jones | 72 | 331 | 18889 |
Sanjay Singh | 71 | 1133 | 22099 |