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Open AccessJournal ArticleDOI

ASAP7: A 7-nm finFET predictive process design kit

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TLDR
A high density, low-power standard cell architecture, developed using design/technology co-optimization (DTCO), as well as example SRAM cells are shown, and the PDK transistor electrical assumptions are explained, as are the FEOL and BEOL design rules.
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This article is published in Microelectronics Journal.The article was published on 2016-07-01 and is currently open access. It has received 326 citations till now. The article focuses on the topics: Multiple patterning & Front end of line.

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Journal ArticleDOI

In-memory computing with resistive switching devices

TL;DR: This Review Article examines the development of in-memory computing using resistive switching devices, where the two-terminal structure of the devices, theirresistive switching properties, and direct data processing in the memory can enable area- and energy-efficient computation.
Journal ArticleDOI

Modern microprocessor built from complementary carbon nanotube transistors

TL;DR: This work experimentally validates a promising path towards practical beyond-silicon electronic systems and proposes a manufacturing methodology for carbon nanotubes, a set of combined processing and design techniques for overcoming nanoscale imperfections at macroscopic scales across full wafer substrates.
Journal ArticleDOI

A Majority-Based Imprecise Multiplier for Ultra-Efficient Approximate Image Multiplication

TL;DR: This study proposes an ultra-efficient imprecise 4:2 compressor and multiplier circuits as the building blocks of the approximate computing systems and indicates that the proposed inexact multiplier provides a significant compromise between accuracy and design efficiency for approximate computing.
Journal ArticleDOI

Chipyard: Integrated Design, Simulation, and Implementation Framework for Custom SoCs

TL;DR: The Chipyard framework is presented, an integrated SoC design, simulation, and implementation environment for specialized compute systems, that includes configurable, composable, open-source, generator-based IP blocks that can be used across multiple stages of the hardware development flow while maintaining design intent and integration consistency.
Journal ArticleDOI

Performance Evaluation of 7-nm Node Negative Capacitance FinFET-Based SRAM

TL;DR: It is demonstrated that for ferroelectric thickness below a critical value, SRAMs with higher hold and read stability, better write-ability, lower leakage as well as faster read access time can be designed at the cost of increased write delay.
References
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Book

Semiconductor Material and Device Characterization

TL;DR: In this article, the authors present a characterization of the resistivity of a two-point-versus-four-point probe in terms of the number of contacts and the amount of contacts in the probe.
Proceedings ArticleDOI

Dark silicon and the end of multicore scaling

TL;DR: The study shows that regardless of chip organization and topology, multicore scaling is power limited to a degree not widely appreciated by the computing community.
Journal ArticleDOI

Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration

TL;DR: In this paper, a model describing the maximum clock frequency distribution of a microprocessor is derived and compared with wafer sort data for a recent 0.25-/spl mu/m microprocessor.
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