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Journal ArticleDOI

When group-III nitrides go infrared: New properties and perspectives

Junqiao Wu
- 01 Jul 2009 - 
- Vol. 106, Iss: 1, pp 011101
TLDR
In this paper, the bandgap of InN was revised from 1.9 eV to a much narrower value of 0.64 eV, which is the smallest bandgap known to date.
Abstract
Wide-band-gap GaN and Ga-rich InGaN alloys, with energy gaps covering the blue and near-ultraviolet parts of the electromagnetic spectrum, are one group of the dominant materials for solid state lighting and lasing technologies and consequently, have been studied very well. Much less effort has been devoted to InN and In-rich InGaN alloys. A major breakthrough in 2002, stemming from much improved quality of InN films grown using molecular beam epitaxy, resulted in the bandgap of InN being revised from 1.9 eV to a much narrower value of 0.64 eV. This finding triggered a worldwide research thrust into the area of narrow-band-gap group-III nitrides. The low value of the InN bandgap provides a basis for a consistent description of the electronic structure of InGaN and InAlN alloys with all compositions. It extends the fundamental bandgap of the group III-nitride alloy system over a wider spectral region, ranging from the near infrared at ∼1.9 μm (0.64 eV for InN) to the ultraviolet at ∼0.36 μm (3.4 eV for GaN...

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Citations
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Journal ArticleDOI

Experiment-simulation comparison of luminescence properties of GaN/InGaN/GaN double graded structures

TL;DR: In this paper, a Zig-Zag quantum well (QW) structure with a composition grading and subsequent polarization doping was designed by increasing the indium composition from 3% to a maximum value then back to 3%.

Nanoscale mapping of the full strain tensor, rotation and composition in partially relaxed In$_x$Ga$_{1-x}$N layers by scanning X-ray diffraction microscopy

TL;DR: In this article , the authors demonstrate a microscopic mapping of the full tensors of strain and lattice orientation by means of scanning X-ray diffraction microscopy.
Journal ArticleDOI

Reactive nitrogen source based on ECR discharge sustained by 24 GHz radiation

TL;DR: In this article, a source of reactive nitrogen based on ECR discharge plasma, sustained by technological gyrotron radiation, was described, and measurements of atomic nitrogen flux were conducted by mass-spectrometric analysis of the products of the reaction of nitrogen monoxide with atomic nitrogen.
Journal ArticleDOI

The fine structure constant determines spontaneous emission rates from semiconductors

TL;DR: The probability of spontaneous emission from a semiconductor, per oscillation of the optical field, is proportional to the cube of the fine structure constant α and the ratio of the semiconductor dipole parameter Ep to hydrogen's Rydberg energy.
Journal ArticleDOI

Effect of Strain-Modulated Multiple Quantum Wells on Carrier Dynamics and Spectral Sensitivity of III-Nitride Photosensitive Devices

TL;DR: In this article, the effect of GaN/In on planar solar cells with different In compositions in all crystallographic orientations has been investigated, and a conversion efficiency of 21% with 74% fill factor is achieved from strain modulated four quantum well based solar cell considering 10% of ‘In' content under one sun AM1.5G illumination.
References
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Book

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Journal ArticleDOI

Room-temperature ultraviolet nanowire nanolasers

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Journal ArticleDOI

Band parameters for III–V compound semiconductors and their alloys

TL;DR: In this article, the authors present a comprehensive, up-to-date compilation of band parameters for the technologically important III-V zinc blende and wurtzite compound semiconductors.
Journal ArticleDOI

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Journal ArticleDOI

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TL;DR: The band structure of InSb is calculated using the k ·. p perturbation approach and assuming that the conduction and valence band extrema are at k = 0 as mentioned in this paper.
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