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Journal ArticleDOI

When group-III nitrides go infrared: New properties and perspectives

Junqiao Wu
- 01 Jul 2009 - 
- Vol. 106, Iss: 1, pp 011101
TLDR
In this paper, the bandgap of InN was revised from 1.9 eV to a much narrower value of 0.64 eV, which is the smallest bandgap known to date.
Abstract
Wide-band-gap GaN and Ga-rich InGaN alloys, with energy gaps covering the blue and near-ultraviolet parts of the electromagnetic spectrum, are one group of the dominant materials for solid state lighting and lasing technologies and consequently, have been studied very well. Much less effort has been devoted to InN and In-rich InGaN alloys. A major breakthrough in 2002, stemming from much improved quality of InN films grown using molecular beam epitaxy, resulted in the bandgap of InN being revised from 1.9 eV to a much narrower value of 0.64 eV. This finding triggered a worldwide research thrust into the area of narrow-band-gap group-III nitrides. The low value of the InN bandgap provides a basis for a consistent description of the electronic structure of InGaN and InAlN alloys with all compositions. It extends the fundamental bandgap of the group III-nitride alloy system over a wider spectral region, ranging from the near infrared at ∼1.9 μm (0.64 eV for InN) to the ultraviolet at ∼0.36 μm (3.4 eV for GaN...

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Citations
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Journal ArticleDOI

Effects of Surface Treatment on the Performance of PEDOT: PSS/n-GaN Schottky Solar Cells

TL;DR: In this article, a heterojunction-based Schottky solar cell consisting of π-conjugated polymers and n-type GaN was developed to improve the performance of solar cells.
Journal ArticleDOI

Nanoscale Mapping of the Full Strain Tensor, Rotation, and Composition in Partially Relaxed <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:msub><mml:mi>In</mml:mi><mml:mi>x</mml:mi></mml:msub><mml:msub><mml:mi>Ga</mml:mi><mml:mrow><mml:mn>1</mml:mn>

TL;DR: In this paper , the authors demonstrate a microscopic mapping of the full tensors of strain and lattice orientation by means of scanning x-ray diffraction microscopy, and apply the technique to a patterned double layer to study strain relaxation and indium incorporation phenomena.
Journal ArticleDOI

Confined and propagating optical phonons in double-channel AlGaN/GaN heterostructures

TL;DR: Based on the dielectric continuous model, the confined and propagating optical phonon modes in AlGaN/GaN double-channel heterostructures were studied by using the transfer matrix method as discussed by the authors.
Journal ArticleDOI

Property comparison of polarons in zinc-blende and wurtzite GaN/AlN quantum wells

TL;DR: In this paper, the properties of polarons in zinc-blende and wurtzite GaN/AlN quantum wells with Frohlich interaction Hamiltonians are compared in detail.
Proceedings ArticleDOI

Novel Dilute III-nitride Materials Growth and Characterization for Device Applications

TL;DR: In this paper, the structural, electrical, phonon and optical properties of the conventional group III-nitrides with special emphasis on characterizing their lattice dynamical and defect traits are presented.
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Journal ArticleDOI

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