scispace - formally typeset
Journal ArticleDOI

Analysis of enhanced light emission from highly strained germanium microbridges

Reads0
Chats0
TLDR
In this paper, high-strained germanium on silicon samples with up to 3.1% uniaxial strain is fabricated and then investigated by Raman spectroscopy.
Abstract
Highly strained germanium on silicon samples with up to 3.1% uniaxial strain are fabricated and then investigated by Raman spectroscopy. During optical pumping, changes in both the emission wavelength and output power are observed, indicating that bandgap modification and optical gain are occurring.

read more

Citations
More filters
Patent

Engineered band gaps

TL;DR: In this paper, the first and second semiconducting atomically thin layers are located proximate to each other, and an angular difference between the first lattice direction and the second lattice directions is between about 0.000001° and 0.5°, or about a 0.
Journal ArticleDOI

Surface Morphology Transformation Under High-Temperature Annealing of Ge Layers Deposited on Si(100)

TL;DR: The data obtained suggest that the porous SiGe layers are formed due to melting of the strained Ge layers and their solidification in the conditions of SiGe dewetting on Si, and may have properties interesting for applications.
Journal ArticleDOI

Micro and nanofabrication of SiGe/Ge bridges and membranes by wet-anisotropic etching

TL;DR: In this paper, the tuning of TMAH and KOH to etch selectively the pure Si preserving the SiGe alloy has been discussed, and the goal of this work is to remove completely the Si under the structures without damaging the Si material present in the Si ge alloys by using a suitable etchant.
Patent

Method for forming a semiconducting portion by epitaxial growth on a strained portion

TL;DR: In this article, the formation of a semiconducting portion ( 60 ) by epitaxial growth on a strained germination portion ( 40 ), comprising the steps in which a cavity ( 21 ) is produced under a structured part ( 11 ) by rendering free a support layer ( 30 ) situated facing the structured part, then being strained.
Journal ArticleDOI

Strain Engineering of Germanium Nanobeams by Electrostatic Actuation.

TL;DR: It is demonstrated, based on mechanical and electrical simulations, that axial strains over 4% can be achieved without experiencing any mechanical and/or electrical failure and it is anticipated that electrostatic actuation of Ge nanobeams provides a suitable platform for the realization of the on-chip tunable-wavelength infrared light sources that can be monolithically integrated on Si chips.
References
More filters
Journal ArticleDOI

Silicon optical modulators

TL;DR: The techniques that have, and will, be used to implement silicon optical modulators, as well as the outlook for these devices, and the candidate solutions of the future are discussed.
Journal ArticleDOI

High-performance Ge-on-Si photodetectors

TL;DR: In this article, the authors summarized the major developments in Ge-on-Si photodetectors, including epitaxial growth and strain engineering, free-space and waveguide-integrated devices, as well as recent progress in Geon-On-Si avalanche photodets.
Journal ArticleDOI

Electrically pumped hybrid AlGaInAs-silicon evanescent laser

TL;DR: An electrically pumped AlGaInAs-silicon evanescent laser architecture where the laser cavity is defined solely by the silicon waveguide and needs no critical alignment to the III-V active material during fabrication via wafer bonding is reported.
Journal ArticleDOI

Nonlinear silicon photonics

TL;DR: In this article, a review of nonlinear effects in silicon and highlights the important applications and technological solutions in nonlinear silicon photonics is presented. But the authors do not discuss the nonlinearities in silicon.
Journal ArticleDOI

Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors

TL;DR: A review of the history and current progress in highmobility strained Si, SiGe, and Ge channel metal-oxide-semiconductor field effect transistors (MOSFETs) can be found in this article.
Related Papers (5)