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Institution

Westinghouse Electric

CompanyCranberry Township, Pennsylvania, United States
About: Westinghouse Electric is a company organization based out in Cranberry Township, Pennsylvania, United States. It is known for research contribution in the topics: Brake & Signal. The organization has 27959 authors who have published 38036 publications receiving 523387 citations.


Papers
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Patent
20 Oct 1986
TL;DR: A thermal heat transfer member is a planar composite member in which elongated high thermal conductivity fibers are disposed within a matrix material, such as an insulating epoxy or thermoplastic resin, while the fibers are elongated continuous commonly directed graphite fibers.
Abstract: A thermal heat transfer member is disclosed for use with electronic or microwave systems. The thermal heat transfer member comprises a generally planar composite member in which elongated high thermal conductivity fibers are disposed within a matrix material. The matrix material may be an insulating epoxy or thermoplastic resin, while the fibers are elongated continuous commonly directed graphite fibers. The fiber ends terminate at a thermal contact surface which is interfaced with a heat sink. The thermal contact surface may be the transverse edge of the planar member or can be substantially parallel to the planar member. The fiber ends are inclined at an angle with respect to the plane of the planar member to provide for termination of the fibers at the thermal contact surface parallel to the planar member. Heat into the composite member is transferable along the commonly directed graphite fibers.

159 citations

Journal ArticleDOI
TL;DR: In this article, it was shown that all austenitic Fe-Ni-Cr alloys eventually swell during neutron irradiation at a rate of ~1%/dpa over a surprisingly large range of temperature.

158 citations

Journal ArticleDOI
TL;DR: In this article, the effect of surface generation on the C-t response and Zerbst plot is demonstrated and values for s0 are correlated with the density of fast surface states.
Abstract: The interpretation of lifetimes and surface generation velocities determined from pulsed MIS-C measurements is examined. The effect of surface generation on the C-t response and ‘Zerbst’ plot is demonstrated and values for s0 are correlated with the density of fast surface states. Different kinds of surface dominated responses are analyzed and we discuss how the bulk characteristics can be retrieved. It is also shown that pulsing from inversion significantly lowers s0, but for high densities of surface states this technique does not suffice to eliminate surface effects. Finally, an approximate analysis of the C-t data is shown to agree quite well with the more exact analysis and it is then applied to lifetime maps of Si wafers.

158 citations

Patent
08 Apr 1987
TL;DR: In this article, a test driver program is generated from the test cases and a software test specification identifying the test case and expected results, which are printed out indicating the sequence of block linkages generated by each test case, the expected output values and the actual output values.
Abstract: A computer program is verified, unit by unit, by automatically instrumentating the code and generating a test driver program which executes all branches of an instrumented code unit. The code is instrumented by operating processors to standardize the code format and to insert executable tracer statements into each block of reformatted code between control statements. A pseudocode having only control statements and tables identifying valid linkages between blocks of code are generated by another processor for use by a verifier in selecting values of input variables and expected outputs for test cases which execute each block of code in the selected unit. Another processor generates the test driver program from the test cases and a software test specification identifying the test cases and expected results. The test driver program and instrumented code unit are compiled and linked to repeatively execute the instrumented code unit to implement all the test cases. Results of the test cases are printed out indicating the sequence of block linkages generated by each test case, the expected output values and the actual output values.

158 citations

Patent
28 Mar 2001
TL;DR: In this article, the authors present a display system in which subsequent failures of plant equipment and plant systems are predicted to occur and in which the probability of failure before a specified date and the probability for failure after the specified date is determined and displayed and when the desired probability that the equipment not fail prior to the calendar date is specified.
Abstract: A display system in which subsequent failures of plant equipment and plant systems are predicted to occur and in which the probability of failure before a specified date and the probability of failure after a specified date is determined and displayed and in which the calendar date is determined and displayed when the desired probability that the equipment not fail prior to the calendar date is specified The system includes an Equipment Failure And Degradation Module that determines the remaining equipment/system life; a Probability-of-Failure Predictor Module that determines the probability of the equipment/system failing prior to a specified date and the probability of the equipment/system failing after a specified date; and a Date-of-Failure Predictor Module that determines the calendar date that corresponds to a specified probability that equipment not fail prior to the date

157 citations


Authors

Showing all 27975 results

NameH-indexPapersCitations
Takeo Kanade147799103237
Martin A. Green127106976807
Shree K. Nayar11338445139
Dieter Bimberg97153145944
Keith E. Gubbins8546635909
Peter K. Liaw84106837916
Katsushi Ikeuchi7863620622
Mark R. Cutkosky7739320600
M. S. Skolnick7372822112
David D. Woods7231820825
Martin A. Uman6733816882
Michael Keidar6756614944
Terry C. Hazen6635417330
H. Harry Asada6463317358
Michael T. Meyer5922526947
Network Information
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20231
202217
202135
202063
201946
201860