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Journal ArticleDOI

High-performance fully depleted silicon nanowire (diameter /spl les/ 5 nm) gate-all-around CMOS devices

TLDR
In this article, gate-all-around (GAA) n-and p-FETs on a silicon-on-insulator with 5-nm-diameter laterally formed Si nanowire channel were demonstrated.
Abstract
This paper demonstrates gate-all-around (GAA) n- and p-FETs on a silicon-on-insulator with /spl les/ 5-nm-diameter laterally formed Si nanowire channel. Alternating phase shift mask lithography and self-limiting oxidation techniques were utilized to form 140- to 1000-nm-long nanowires, followed by FET fabrication. The devices exhibit excellent electrostatic control, e.g., near ideal subthreshold slope (/spl sim/ 63 mV/dec), low drain-induced barrier lowering (/spl sim/ 10 mV/V), and with I/sub ON//I/sub OFF/ ratio of /spl sim/10/sup 6/. High drive currents of /spl sim/ 1.5 and /spl sim/1.0 mA//spl mu/m were achieved for 180-nm-long nand p-FETs, respectively. It is verified that the threshold voltage of GAA FETs is independent of substrate bias due to the complete electrostatic shielding of the channel body.

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Patent

Structure de nanofil de silicium-germanium empilée, et procédé pour sa formation

TL;DR: In this article, the authors present a procedure for the formation of a nanofil of silicium-germanium empilee and a transistor of the same type.
Journal ArticleDOI

Power and delay analysis of different SRAM cell structures with different technology node

TL;DR: In this paper , the authors compared leakage power, dynamic power and static power at 90 nm and 45 nm technology in nine transistors (9 t), eight transistor (8 t), and six transistor (6 t) sram cell.
Proceedings ArticleDOI

Investigation of Parasitic Capacitance Effects in V-GAA Transistor via 3D PEX Methodology

TL;DR: In this paper , the parasitic capacitance of the V-GAA transistor structure was successfully extracted, which suffer from the different pillar size in SADP process, such as pillar height and width.
Book ChapterDOI

Silicon-based lithium-ion battery anodes and their application in solid-state batteries

TL;DR: In this paper , a comprehensive review of the lithium-ion battery anodes based on silicon is presented and discussed in terms of successful approaches leading to more durable silicon-based nanocomposite architectures that can potentially overcome the existing limitations of the siliconbased anodes.
Book ChapterDOI

Analog/RF Performance Analysis of GAA-GNR Tunnel Field-Effect Transistor (TFET)

TL;DR: In this paper , a gate all round tunneling field effect transistor (GAA TFET) with graphene nanoribbon (GNR) was proposed to improve DC and RF performance.
References
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Journal ArticleDOI

High Performance Silicon Nanowire Field Effect Transistors

TL;DR: In this article, the influence of source-drain contact thermal annealing and surface passivation on key transistor properties was examined, and it was shown that thermal annaling and passivation of oxide defects using chemical modification can increase the average transconductance from 45 to 800 nS and average mobility from 30 to 560 cm 2 /V
Journal ArticleDOI

FinFET-a self-aligned double-gate MOSFET scalable to 20 nm

TL;DR: In this paper, a self-aligned double-gate MOSFET, FinFET was proposed by using boron-doped Si/sub 04/Ge/sub 06/ as a gate material.
Journal ArticleDOI

High-performance thin-film transistors using semiconductor nanowires and nanoribbons

TL;DR: It is shown that high-performance TFTs can be produced on various substrates, including plastics, using a low-temperature assembly process and the approach is general to a broad range of materials including high-mobility materials (such as InAs or InP).
Journal ArticleDOI

Double-gate silicon-on-insulator transistor with volume inversion: A new device with greatly enhanced performance

TL;DR: The double-gate control of silicon-on-insulator (SOI) transistors is used to force the whole silicon film (interface layers and volume) in strong inversion as discussed by the authors.
Journal ArticleDOI

Benchmarking nanotechnology for high-performance and low-power logic transistor applications

TL;DR: The results of this benchmarking exercise indicate that while these novel nanoelectronic devices show promise and opportunities for future logic applications, there still remain shortcomings in the device characteristics and electrostatics that need to be overcome.
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