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Institution

Varian Associates

About: Varian Associates is a based out in . It is known for research contribution in the topics: Beam (structure) & Wafer. The organization has 2160 authors who have published 2591 publications receiving 46002 citations.
Topics: Beam (structure), Wafer, Amplifier, Cathode, Resonance


Papers
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292 citations

Patent
05 Jun 1985
TL;DR: In this paper, the location of the catheter tip is obtained in cooperation with the magnetic resonance imager, where the imager is used to measure the magnetic field at the tip of a catheter.
Abstract: A magnetic resonance catheter system combines. with a magnetic resonance imaging device (10). A catheter (26) comprises means (28, 32, 32', 36) for exciting a weak magnetic field at the tip of the catheter. The location of the catheter tip is, thereby obtained in cooperation with the magnetic resonance imager (10).

257 citations

Patent
26 May 1989
TL;DR: In this article, a modular wafer processing machine is provided which is based on interconnected handling units having wafer handling arms, each unit can pass a wafer to another unit in the same vacuum environment to a processing module.
Abstract: A modular wafer processing machine is provided which is based on interconnected handling units having wafer handling arms. Each unit can pass a wafer to another unit in the same vacuum environment to a processing module.

244 citations

Patent
28 Apr 1987
TL;DR: In this paper, a solar cell is used to sense actual wafer position by sensing the wafer edge as it is rotated, and the required correction and rotation are calculated from the solar cell output.
Abstract: Wafer transfer apparatus for horizontal transfer of a wafer between a cassette and an input station of a vacuum processing system includes a wafer transfer arm with a primary section linked to a secondary section so as to move a wafer in a straight line to a location and orientation station and then to the input station. The actual location of the wafer center and the angular orientation of the wafer flat are determined, and the wafer is rotated to a desired angular orientation at the location and orientation station. A solar cell is used to sense actual wafer position by sensing the wafer edge as it is rotated. The required correction and rotation are calculated from the solar cell output. As the wafer is transferred to the input station, correcting displacements are added to the movement so that the wafer is accurately positioned at the input station. A strain gauge is used to reliably sense wafer presence or absence on the transfer arm.

212 citations


Authors

Showing all 2160 results

NameH-indexPapersCitations
Richard R. Ernst9635253100
Fred E. Regnier8841225169
Norbert Schuff8828025442
James S. Hyde7941235755
Carl Djerassi77152337630
Ray Freeman7326922872
Robert Kaptein7243624275
Minghwei Hong5851514309
Jesse L. Beauchamp5527510971
Herbert Kroemer522379936
Hans J. Jakobsen492748401
James N. Eckstein421686634
Ivan Bozovic311285060
John Glushka31763004
Gary Virshup241132374
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20171
20161
20122
20111
20104
20093