Institution
Varian Associates
About: Varian Associates is a based out in . It is known for research contribution in the topics: Beam (structure) & Wafer. The organization has 2160 authors who have published 2591 publications receiving 46002 citations.
Topics: Beam (structure), Wafer, Amplifier, Cathode, Resonance
Papers published on a yearly basis
Papers
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314 citations
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292 citations
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05 Jun 1985TL;DR: In this paper, the location of the catheter tip is obtained in cooperation with the magnetic resonance imager, where the imager is used to measure the magnetic field at the tip of a catheter.
Abstract: A magnetic resonance catheter system combines. with a magnetic resonance imaging device (10). A catheter (26) comprises means (28, 32, 32', 36) for exciting a weak magnetic field at the tip of the catheter. The location of the catheter tip is, thereby obtained in cooperation with the magnetic resonance imager (10).
257 citations
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26 May 1989TL;DR: In this article, a modular wafer processing machine is provided which is based on interconnected handling units having wafer handling arms, each unit can pass a wafer to another unit in the same vacuum environment to a processing module.
Abstract: A modular wafer processing machine is provided which is based on interconnected handling units having wafer handling arms. Each unit can pass a wafer to another unit in the same vacuum environment to a processing module.
244 citations
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28 Apr 1987TL;DR: In this paper, a solar cell is used to sense actual wafer position by sensing the wafer edge as it is rotated, and the required correction and rotation are calculated from the solar cell output.
Abstract: Wafer transfer apparatus for horizontal transfer of a wafer between a cassette and an input station of a vacuum processing system includes a wafer transfer arm with a primary section linked to a secondary section so as to move a wafer in a straight line to a location and orientation station and then to the input station. The actual location of the wafer center and the angular orientation of the wafer flat are determined, and the wafer is rotated to a desired angular orientation at the location and orientation station. A solar cell is used to sense actual wafer position by sensing the wafer edge as it is rotated. The required correction and rotation are calculated from the solar cell output. As the wafer is transferred to the input station, correcting displacements are added to the movement so that the wafer is accurately positioned at the input station. A strain gauge is used to reliably sense wafer presence or absence on the transfer arm.
212 citations
Authors
Showing all 2160 results
Name | H-index | Papers | Citations |
---|---|---|---|
Richard R. Ernst | 96 | 352 | 53100 |
Fred E. Regnier | 88 | 412 | 25169 |
Norbert Schuff | 88 | 280 | 25442 |
James S. Hyde | 79 | 412 | 35755 |
Carl Djerassi | 77 | 1523 | 37630 |
Ray Freeman | 73 | 269 | 22872 |
Robert Kaptein | 72 | 436 | 24275 |
Minghwei Hong | 58 | 515 | 14309 |
Jesse L. Beauchamp | 55 | 275 | 10971 |
Herbert Kroemer | 52 | 237 | 9936 |
Hans J. Jakobsen | 49 | 274 | 8401 |
James N. Eckstein | 42 | 168 | 6634 |
Ivan Bozovic | 31 | 128 | 5060 |
John Glushka | 31 | 76 | 3004 |
Gary Virshup | 24 | 113 | 2374 |