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Fundamentals of Power Semiconductor Devices

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TLDR
In this article, the fundamental physics of power semiconductor devices are discussed and an analytical model for explaining the operation of all power Semiconductor devices is presented, focusing on silicon devices.
Abstract
Fundamentals of Power Semiconductor Devices provides an in-depth treatment of the physics of operation of power semiconductor devices that are commonly used by the power electronics industry. Analytical models for explaining the operation of all power semiconductor devices are shown. The treatment focuses on silicon devicesandincludes the unique attributes and design requirements for emerging silicon carbide devices.

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Citations
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Journal ArticleDOI

Fast Switching $\beta$ -Ga 2 O 3 Power MOSFET With a Trench-Gate Structure

TL;DR: In this letter, trench-gate metal–oxide–semiconductor field-effect transistors on (010) and Ga-2-O-3 epitaxial layer are fabricated, and the static and dynamic switching properties of the trench-Gate device show the potential of inline-formula.
Journal ArticleDOI

Medium Voltage Soft-Switching DC/DC Converter With Series-Connected SiC MOSFETs

TL;DR: A medium voltage series resonant converter (MVSRC) with series-connected SiC MOSFETs is proposed, and experimental results show that the voltage imbalance is reduced effectively and the switching loss is decreased dramatically.
Proceedings ArticleDOI

Comparative evaluation of isolated front end and isolated back end multi-cell SSTs

TL;DR: In this paper, an isolated front end (IFE) SST concept is proposed to reduce the complexity and physical size of the MV side converter assemblies compared to the well-known isolated back end (IBE) topologies, and the IFE approach performs the entire grid current and output voltage control on the LV side using standard non-isolated |AC|DC boost converter stages.
References
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Book

Modern power devices

TL;DR: In this article, the authors introduce the concept of field effect transistors in the context of rectifier concepts and introduce a new Rectifier concept called Field Effect Transistor (FET) this article.
Journal ArticleDOI

Silicon-carbide high-voltage (400 V) Schottky barrier diodes

TL;DR: In this paper, the fabrication and characteristics of the first high-voltage (400-V) silicon-carbide (6H-SiC) Schottky barrier diodes are described.
Journal ArticleDOI

Temperature dependence of hole impact ionization coefficients in 4H and 6H-SiC

TL;DR: In this paper, hole impact ionization coefficients have been accurately measured as a function of temperature in both 4H and 6H-SiC using the pulsed electron beam induced current (P-EBIC) technique.
Journal ArticleDOI

Evolution of MOS-bipolar power semiconductor technology

TL;DR: A review of the evolution of a power transistor technology based on MOS gate control is provided in this article, which offers the advantage of very high input impedance, which allows the control of the devices using low-cost integrated circuits.