scispace - formally typeset
Journal ArticleDOI

High breakdown voltage AlGaN-GaN power-HEMT design and high current density switching behavior

TLDR
AlGaN-GaN power high-electron mobility transistors (HEMTs) with 600-V breakdown voltage are fabricated and demonstrated as switching power devices for motor drive and power supply applications.
Abstract
AlGaN-GaN power high-electron mobility transistors (HEMTs) with 600-V breakdown voltage are fabricated and demonstrated as switching power devices for motor drive and power supply applications. The fabricated power HEMT realized the high breakdown voltage by optimized field plate technique and the low on-state resistance of 3.3 m/spl Omega/cm/sup 2/, which is 20 times lower than that or silicon MOSFETs, thanks to the high critical field of GaN material and the high mobility in 2DEG channel. The fabricated devices also demonstrated the high current density switching of 850 A/cm/sup 2/ turn-off. These results show that AlGaN-GaN power-HEMTs are one of the most promising candidates for future switching power device for power electronics applications.

read more

Citations
More filters
Patent

Gallium nitride material devices and associated methods

TL;DR: The gallium nitride transistors can be used in RF power applications, amongst others as mentioned in this paper, which can lead to a number of advantages including reduced gate-drain feedback capacitance, reduced surface electron concentration, increased breakdown voltage, and improved device reliability.
Patent

Enhancement mode GaN HEMT device

TL;DR: An enhancement-mode GaN transistor as mentioned in this paper includes a substrate, transition layers, a buffer layer, a barrier layer comprised of a III Nitride material, drain and source contacts, a gate III-V compound containing acceptor type dopant elements, and a gate metal.
Journal ArticleDOI

Schottky barrier diode embedded AlGaN/GaN switching transistor

TL;DR: In this paper, a Schottky barrier diode (SBD) was embedded in a recessed normally off AlGaN/GaN-on-Si metal-oxide-semiconductor heterostructure field effect transistor (MOSHFET).
Journal ArticleDOI

Characterization of Recessed-Gate AlGaN/GaN HEMTs as a Function of Etch Depth

TL;DR: In this paper, a set of high-electron-mobility transistors were fabricated using a Cl2-based plasma etch to study device performance as a function of recess depth, and the threshold voltage approached zero as the recess approached the AlGaN/GaN heterojunction.
References
More filters
Journal ArticleDOI

Trends in power semiconductor devices

TL;DR: In this paper, the authors review recent trends in power semiconductor device technology that are leading to improvements in power losses for power electronic systems and predict that silicon carbide based switches will begin to displace these silicon devices.
Journal ArticleDOI

Wide bandgap compound semiconductors for superior high-voltage unipolar power devices

TL;DR: In this article, a critical evaluation of the performance capabilities of various wide bandgap semiconductors for high power and high frequency unipolar electronic devices is presented, and seven different figures of merit have been analyzed.
Proceedings ArticleDOI

A new generation of high voltage MOSFETs breaks the limit line of silicon

TL;DR: In this article, the authors proposed a new device concept for high voltage power devices based on charge compensation in the drift region of the transistor, which achieved a shrink factor of 5 versus the actual state of the art in power MOSFETs.
Journal ArticleDOI

10-W/mm AlGaN-GaN HFET with a field modulating plate

TL;DR: In this paper, a 1mm-wide field modulating plate (FP) was used to achieve a power density of 10.3 W with a linear gain of 18.0 dB and a power added efficiency of 47.3% at 2 GHz.
Journal ArticleDOI

High breakdown GaN HEMT with overlapping gate structure

TL;DR: In this paper, a GaN high electron mobility transistors (HEMTs) were fabricated using an overlapping-gate technique in which the drain-side edge of the metal gate overlaps on a high breakdown and high dielectric constant dielectrics.
Related Papers (5)