Agilent Technologies

About: Agilent Technologies is a company organization based out in Santa Clara, California, United States. It is known for research contribution in the topics: Signal & Mass spectrometry. The organization has 7398 authors who have published 11518 publications receiving 262410 citations. The organization is also known as: Agilent Technologies, Inc..

Impedance based apparatuses and methods for analyzing cells and particles

Abstract: A device for monitoring the migration or invasion of a biological particle such as a cell is disclosed. The device includes an upper chamber adapted to receive and retain a cell sample, a lower chamber having at least two electrodes, and a biocompatible porous membrane having a porosity sufficient to allow cells to migrate therethrough. The membrane is disposed in the device so as to separate the upper and lower chambers from one another. Migration of cells through the porous membrane permits contact between the migrating cells and one or more electrodes of the lower chamber. The contact provides a detectable change in impedance between or among the electrodes.

Advanced arbitrary waveform generator

Abstract: An advanced arbitrary waveform generator (“AAWG”) for producing an arbitrary waveform is disclosed. The AAWG may include a direct digital synthesis (“DDS”) module in signal communication with a sequence memory and a multiplication module in signal communication with both the DDS module and a waveform memory, where the multiplication module receives signal waveform data from the waveform memory and multiplies the received signal waveform data with a DDS output signal to produce the arbitrary waveform signal.

Device for high throughput sample processing, analysis and collection, and methods of use thereof

Abstract: A microanalysis device having a plurality of sample processing compartments is described for use in liquid phase analysis. A microanalysis device system, comprising a plurality of interconnected microanalysis devices. The device is formed by microfabrication of microstructures in novel support substrates. The invention herein can be used for the analysis of small and/or macromolecular and/or other solutes in the liquid phase.

Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration

Abstract: A method of measuring a DUT provides a vector network analyzer with at least two measurement ports and measures characteristics of thru, reflect, and line calibration standards at the measurement ports. Error coefficients are calculated as well as a shifted electrical length attributable to the measured calibration standards. S-parameters of the DUT are measured and corrected based upon the error coefficients. A reference plane is shifted for each element of the corrected S-parameter matrix to a measurement reference plane, and Γ SA_portn Γ LA_portm = S 21 ⁢ _thru ⁢ _nm ⁢ S 12 ⁢ _thru ⁢ _nm wherein S 21 — thru — nm is equal to S 12 — thru — mn and an argument of both solutions for S 21 — thru — nm is fit to a straight line, the solution having a y-intercept closest to zero being a correct solution and a resulting argument of the correct solution being the electrical delay.