Agilent Technologies

About: Agilent Technologies is a company organization based out in Santa Clara, California, United States. It is known for research contribution in the topics: Signal & Mass spectrometry. The organization has 7398 authors who have published 11518 publications receiving 262410 citations. The organization is also known as: Agilent Technologies, Inc..

Microanalytical device and use thereof for conducting chemical processes

Abstract: A microanalytical device is provided for conducting chemical processes using small amounts of fluid. The devices include microstructures, e.g., microcavities, microchannels and the like, that are laser ablated or otherwise formed in a support substrate, and can be used in a variety of chemical and biochemical methods, including chromatographic, electrophoretic and electrochromatographic separations, screening and diagnostics, and chemical and biochemical synthesis. The devices are formed from a material that is thermally and chemically stable and resistant to biofouling, significantly reducing electroosmotic flow and unwanted adsorption of solute. Preferred materials are polymeric.

Temperature dependence of impact ionization in GaAs

Abstract: The temperature dependence of electron and hole impact ionization in gallium arsenide (GaAs) has been determined from photomultiplication measurements at temperatures between 20 K and 500 K. It is found that impact ionization is suppressed by increasing temperature because of the increase in phonon scattering. Temperature variations in avalanche multiplication are shown to decrease with decreasing avalanching region width, and the effect is interpreted in terms of the reduced phonon scattering in the correspondingly reduced ionization path length. Effective electron and hole ionization coefficients are derived and are shown to predict accurately multiplication characteristics and breakdown voltage as a function of temperature in p/sup +/in/sup +/ diodes with i-regions as thin as 0.5 /spl mu/m.

Add-on module for synchronizing operations of a plurality of devices

Abstract: A system and method are provided which add, via an add-on module, synchronization functionality to an instrument that does not otherwise support such synchronization functionality. Various synchronization techniques may be supported by the synchronization module. For instance, in certain embodiments the synchronization module supports message-based synchronization techniques and/or time-based synchronization techniques. Accordingly, in certain embodiments, the add-on module supports synchronization with another device (e.g., another instrument or another add-on module coupled to an instrument) via synchronized local clocks (e.g., IEEE 1588) and messaging over a communication network. In certain embodiments, the add-on module additionally or alternatively supports the use of “time bombs” to trigger scheduled actions on the instrument with which the synchronization module is interfaced.

Split resistor probe and method

Abstract: Disclosed is a system and method for probing target pads in a dense pad array while minimizing distortion of a signal on the pads probed due to the probe load on the target pads and minimizing an amount of cross-talk between aggressor conductors in the dense pad array and the probe tip. In one embodiment, a probe tip arrangement is provided comprising a pad located in a dense pad array and a first probe tip resistor having first and second ends, the first end being coupled to the pad. The first probe tip resistor is positioned directly adjacent to the pad as closely as manufacturing processes will allow. The probe tip arrangement further includes an access transmission line coupled to the second end of the first probe tip resistor and extending outside of the dense pad array to a second probe tip resistor. The second probe tip resistor may, in turn, be coupled to an electrical connector which in turn is coupled to a logic analyzer or oscilloscope to test the signal on the respective pad of the pad array.