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Institution

Amkor Technology

CompanyTempe, Arizona, United States
About: Amkor Technology is a company organization based out in Tempe, Arizona, United States. It is known for research contribution in the topics: Semiconductor package & Substrate (printing). The organization has 1069 authors who have published 1106 publications receiving 26778 citations. The organization is also known as: Amkor & Amkor Technology, Inc..


Papers
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Patent
17 Jun 2010
TL;DR: In this article, the first metal plating is formed on a top terminal end section of the first plurality of segmented metal traces and a conductive coating is applied to the mold compound.
Abstract: A semiconductor device has a substrate having a plurality of metal traces. A die is electrically attached to a first surface of the substrate. A first plurality of segmented metal traces is formed around a perimeter of the first surface of the substrate, wherein an end section of the first plurality of segmented metal traces is exposed. A mold compound is used for encapsulating the semiconductor device. A first metal plating is formed on a top terminal end section of the first plurality of segmented metal traces. The first metal plating is spread to at least one of the mold compound or the exposed end sections of the first plurality of segmented metal traces. A conductive coating is applied to the mold compound, the exposed end sections of the first plurality of segmented metal traces and to the first metal plating.

10 citations

Patent
23 Dec 2008
Abstract: A semiconductor package and a method of producing the same has a substrate. A first semiconductor chip is coupled to a surface of the substrate. The first semiconductor chip has a first and second surfaces which are substantially flat in nature. An adhesive layer is coupled to the second surface of the first semiconductor chip. A second semiconductor chip having first and second surfaces which are substantially flat in nature is further provided. An insulator is coupled to the first surface of the second semiconductor chip for preventing shorting of wirebonds. The second semiconductor chip is coupled to the adhesive layer by the insulator coupled to the first surface thereof.

10 citations

Patent
26 Apr 2011
TL;DR: In this paper, the authors provided multiple embodiments of a semiconductor package including one or more semiconductor dies which are electrically connected to an underlying substrate through the use of a conductive pattern which is at least partially embedded in a patterning layer of the package.
Abstract: In accordance with the present invention, there is provided multiple embodiments of a semiconductor package including one or more semiconductor dies which are electrically connected to an underlying substrate through the use of a conductive pattern which is at least partially embedded in a patterning layer of the package. In a basic embodiment of the present invention, the semiconductor package comprises a substrate having a conductive pattern disposed thereon. Electrically connected to the conductive pattern of the substrate is at least one semiconductor die. The semiconductor die and the substrate are at least partially encapsulated by a patterning layer. Embedded in the patterning layer is a wiring pattern which electrically connects the semiconductor die to the conductive pattern. A portion of the wiring pattern is exposed in the patterning layer.

10 citations

Patent
21 Apr 2005
TL;DR: In this paper, a die-mounting substrate and a method incorporating dummy traces for improving mounting film planarity is presented, which makes the use of film attach possible with a simplified manufacturing process and in applications where film attach was not previously practical.
Abstract: A die-mounting substrate and method incorporating dummy traces for improving mounting film planarity makes the use of film attach possible with a simplified manufacturing process and in applications where film-attach was not previously practical. The die-mounting substrate includes dummy traces that are generated along with signal traces extending into the die mounting area of the substrate. The dummy traces are designed according to the same design rules as the signal traces and are disposed in otherwise empty regions between signal traces and vias within the die mounting area. The result is die mounting area without regions empty of signal traces that previously either lack conductor or are filled completely with conductor, either of which will result in surface variation that compromises the film bond.

10 citations

Patent
21 Oct 2003
TL;DR: A semiconductor package comprising a semiconductor die which has opposed first and second surfaces and at least first-and second bond pads disposed on the second surface thereof is defined in this paper.
Abstract: A semiconductor package comprising a semiconductor die which has opposed first and second surfaces and at least first and second bond pads disposed on the second surface thereof. In addition to the semiconductor die, the semiconductor package includes at least one lead having opposed first and second surfaces, the first surface of the lead being electrically connected to the first bond pad. Also included in the semiconductor package is at least one conductive post having opposed first and second surfaces, the first surface of the conductive post being electrically connected to the second bond pad. A package body at least partially encapsulates the semiconductor die, the lead, and the conductive post such that the second surface of the lead and the second surface of the conductive post are exposed in a common exterior surface of the package body.

10 citations


Authors

Showing all 1070 results

NameH-indexPapersCitations
Thomas P. Glenn481306676
Dong-Hoon Lee4876223162
Joungho Kim405797365
Steven Webster34833322
Young Bae Park332164325
Roy Dale Hollaway28532324
Ronald Patrick Huemoeller26912385
Robert Francis Darveaux23701881
MinJae Lee23993083
Il Kwon Shim21411403
Vincent DiCaprio20271973
Sukianto Rusli19441308
Glenn A. Rinne1934898
Ahmer Syed18551192
David Jon Hiner18541173
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20221
202112
202022
201922
201832
201728