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Institution

Amkor Technology

CompanyTempe, Arizona, United States
About: Amkor Technology is a company organization based out in Tempe, Arizona, United States. It is known for research contribution in the topics: Semiconductor package & Substrate (printing). The organization has 1069 authors who have published 1106 publications receiving 26778 citations. The organization is also known as: Amkor & Amkor Technology, Inc..


Papers
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Patent
31 Jan 2003
TL;DR: In this paper, a power MOSFET die is electrically connected to a portion of the substrate with a metal strap, and at least portions of the die and substrate are encapsulated in an insulative encapsulant, such as molded plastic.
Abstract: Semiconductor devices and methods of forming such devices are disclosed. The devices include a package allowing for increased thermal dissipation. In one embodiment, the device includes a power MOSFET die that is electrically connected to a portion of the substrate with a metal strap. The die and at least portions of the strap and substrate are encapsulated in an insulative encapsulant, such as molded plastic. A top surface of the strap is exposed to the environment through the encapsulant. The exposed surface may have grooves formed therein, or fins formed thereon, to facilitate heat transfer.

28 citations

Patent
27 Mar 2000
TL;DR: In this article, a method for electrically connecting a semiconductor die to a substrate on which the die is mounted, with a conductive strap, such that the connection is resistant to the shear stresses incident upon it with changes in temperature of the device.
Abstract: This invention provides a method apparatus for electrically connecting a semiconductor die, such as a power MOSFET, to a substrate on which the die is mounted, e.g., a lead frame, with a conductive strap, such that the connection is resistant to the shear stresses incident upon it with changes in temperature of the device. The method includes providing a conductive strap, and in one embodiment thereof, forming a recess in the top surface of the substrate. The bottom surface of a flange portion of the strap is attached to the floor of the recess such that the recess captures the flange and prevents relative horizontal movement of the flange and substrate with variations in the temperature of the device. Other embodiments include attaching the strap to the die and substrate with joints of a resilient conductive elastomer, and forming apertures in the strap and substrate that cooperate with a conductive joint material to reinforce the connection against temperature-induced shear forces.

28 citations

Patent
26 Jul 2001
TL;DR: In this paper, an electronic device, such as a sensor die, is packaged by first forming a hole through a substrate, and a tape is then applied to the second surface of the substrate to cover a second side of the hole, thereby creating a tape surface at the bottom of hole.
Abstract: An electronic device, such as a sensor die, is packaged by first forming a hole through a substrate. The hole is made large enough to position the entire electronic device within the hole. A tape is then applied to the second surface of the substrate to cover a second side of the hole, thereby creating a tape surface at the bottom of the hole. The electronic device is then positioned within the hole such that the electronic device is in contact with, and adhered to, the tape surface at the bottom of the hole. Electronic connections are made between the electronic device and the substrate and a layer of encapsulant is applied. In one embodiment, the electronic device is a sensor die and an optical element is positioned over an active region of the sensor die before the encapsulant is applied. The encapsulant then surrounds and holds the optical element in position over the active region of the sensor die.

28 citations

Journal ArticleDOI
TL;DR: The solder joint array tests show that for higher test rates and Ag content, there are less bulk solder failures and more interface failures and the average solder joint strength and peak load also decrease under higher test rate and Agcontent.

28 citations

Journal ArticleDOI
TL;DR: In this paper, a first-order model showed that eutectic solder balls provide greater process margins, compared to MPS interconnects, due to the ball collapse during reflow.
Abstract: Ball grid array (BGA) package styles use solder balls as electrical interconnects between packages and application boards. Solder balls are rigid and tend to fracture under thermal fatigue and/or shock loading. Metalized polymer spheres (MPS) offer a more compliant interconnect, compared to solder balls, thereby increasing the thermal cycling fatigue life. A reduction in thermal and electrical performance may be expected for MPS interconnects as a result of its higher thermal and electrical resistances. A 5% and an 8% increase in MPS thermal resistance was measured for a carrier array ball grid array (CABGA) package and a plastic ball grid array (PBGA) package, respectively, compared to eutectic solder balls. However, this small reduction was offset by large gains in the solder joint life. A 1.6 times increase in the mean thermal fatigue life was measured for a CABGA using MPS interconnects compared to eutectic solder balls. A first-order model showed that eutectic solder balls provide greater process margins, compared to MPS interconnects, due to the ball collapse during reflow.

28 citations


Authors

Showing all 1070 results

NameH-indexPapersCitations
Thomas P. Glenn481306676
Dong-Hoon Lee4876223162
Joungho Kim405797365
Steven Webster34833322
Young Bae Park332164325
Roy Dale Hollaway28532324
Ronald Patrick Huemoeller26912385
Robert Francis Darveaux23701881
MinJae Lee23993083
Il Kwon Shim21411403
Vincent DiCaprio20271973
Sukianto Rusli19441308
Glenn A. Rinne1934898
Ahmer Syed18551192
David Jon Hiner18541173
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20221
202112
202022
201922
201832
201728