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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

TL;DR: In this article, the recent progress in n-and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p type, and the major milestones already achieved with this emerging and very promising technology are summarized.
References
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Journal ArticleDOI

Comparative study of quasi-static and normal capacitance–voltage characteristics in amorphous Indium-Gallium-Zinc-Oxide thin film transistors

TL;DR: In this paper, the difference between the normal C-V and the quasi-static C−V characteristics of amorphous Indium-Gallium-Zinc-Oxide (a-IGZO) thin film transistors (TFTs) is investigated with two different measurement configurations.
Journal ArticleDOI

Non-aqueous solution processed ZnO thin film transistors

TL;DR: In this article, a hexagonal structure with a random crystal orientation was found in ZnO thin-film transistors, which exhibited an n-channel enhancement mode behavior, with saturation mobility in the range of 0.95-1.29 cm 2 ǫV − 1ǫs − 1, drain current on-to-off ratios higher than 10 7 and threshold voltages between 5.3 and 16.8 V in an ambient environment.
Journal ArticleDOI

Improvement in the negative bias illumination temperature stress instability of In–Ga–Zn–O thin film transistors using an Al2O3 buffer layer

TL;DR: In this article, the negative bias illumination temperature stress (NBITS) instability of amorphous In-Ga-Zn-O thin film transistors with SiO2 and SiO 2/Al2O3 gate dielectric layers was evaluated.
Journal ArticleDOI

Instability dependent upon bias and temperature stress in amorphous‐indium gallium zinc oxide (a‐IGZO) thin‐film transistors

TL;DR: In this article, the effects of gate bias, drain bias, and temperature on the electrical parameters of amorphous-indium gallium zinc oxide (a-IGZO) thin-film transistors have been investigated.
Journal ArticleDOI

Transparent Ga and Zn co-doped In2O3 electrode prepared by co-sputtering of Ga:In2O3 and Zn:In2O3 targets at room temperature

TL;DR: In this article, the characteristics of Ga and Zn co-sputtered In2O3 (IGZO) electrodes were investigated as a function of IGO and IZO target DC power during the co sputtering process.
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