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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

TL;DR: In this article, the recent progress in n-and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p type, and the major milestones already achieved with this emerging and very promising technology are summarized.
References
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Journal ArticleDOI

Synthesis of Cu2O crystals by galvanic deposition technique

TL;DR: In this paper, a simple galvanic deposition technique has been developed to demonstrate the deposition of cuprous oxide (Cu2O) on transparent conducting oxide substrate for the first time, and the result shows that the morphologies of galvanically obtained Cu2O crystals are mainly dependent on the nature of anions in aqueous solution.
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49.3: A 200-dpi Transparent a-Si TFT Active-Matrix Phosphorescent OLED Display

TL;DR: In this article, a 120×160 high-resolution (200dpi) a-Si TFT active-matrix transparent phosphorescent OLED (PHOLED) display with novel pixel architecture to maximize transparency and aperture ratio and also ensure comparable light emission from both sides of the display.
Journal ArticleDOI

A Study of Parasitic Series Resistance Components in In–Ga–Zn–Oxide (a-IGZO) Thin-Film Transistors

TL;DR: In this article, the authors extracted the effective channel length and parasitic series resistance in a-IGZO inverted-staggered etch-stop (ES) TFTs.
Journal ArticleDOI

P-11: DC/AC Electrical Instability of R.F. Sputter Amorphous In-Ga-Zn-O TFTs

TL;DR: In this paper, the effect of bias-temperature-stressing on the threshold voltage shift was studied for a-IGZO thin-film transistor (TFT) under different stress voltages and temperatures.
Journal ArticleDOI

Influence of thermal parameter on solution-processed Zr-doped ZTO thin-film transistors

TL;DR: In this paper, a Zr-doped zinc tin oxide (ZZTO) channel layer was fabricated as a function of annealing temperatures and the performance of the ZZTO TFT was poor.
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