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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Citations
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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

TL;DR: In this article, the recent progress in n-and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p type, and the major milestones already achieved with this emerging and very promising technology are summarized.
References
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Journal ArticleDOI

Nanometer-Scale Oxide Thin Film Transistor with Potential for High-Density Image Sensor Applications

TL;DR: A novel hybrid CIS architecture based on the combination of nanometer-scale amorphous In-Ga-Zn-O (a-IGZO) thin-film transistors (TFTs) and a conventional Si photo diode (PD) is proposed that aims to overcome the loss of quantum efficiency and image quality due to the continuous miniaturization of PDs.
Journal ArticleDOI

ZnO metal-semiconductor field-effect transistors with Ag-Schottky gates

TL;DR: The n-type conductivity (normally on) of typical MESFETs is tunable over 8 decades in a voltage range of 2.5V with an off voltage of −1.5v and very low off-current density in the range of 10−6A∕cm2 as discussed by the authors.
Journal ArticleDOI

Ultraviolet detecting properties of ZnO-based thin film transistors

TL;DR: ZnO-based thin film transistors have been fabricated on a SiO2/p-Si substrate by rf magnetron sputtering at room temperature and they exhibited a saturation current level of a few μA under a gate bias of 40V, electron mobility of less than 0.05 cm2/V s, and on/off current ratio of ∼105 in the dark.
Journal ArticleDOI

Performance and Stability of Low Temperature Transparent Thin-Film Transistors Using Amorphous Multicomponent Dielectrics

TL;DR: In this article, high performance transparent thin-film transistors are presented and analyzed using sputtered multicomponent oxides as dielectric materials based on mixtures of Ta 2 O 5 with SiO 2 or Al 2 O 3.
Journal ArticleDOI

High-Performance Amorphous Indium–Gallium–Zinc–Oxide Thin-Film Transistor With a Self-Aligned Etch Stopper Patterned by Back-Side UV Exposure

TL;DR: In this paper, the authors report the fabrication of amorphous indium-gallium-zincoxide (a-IGZO) thin-film transistors with a bottom-gate inverted-staggered structure with an etch stopper formed by a self-aligned process using back-side UV exposure.
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