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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
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TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

TL;DR: In this article, the recent progress in n-and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p type, and the major milestones already achieved with this emerging and very promising technology are summarized.
References
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Journal ArticleDOI

High-Performance Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors With $\hbox{HfO}_{x}\hbox{N}_{y}/\hbox{HfO}_{2}/\hbox{HfO}_{x}\hbox{N}_{y}$ Tristack Gate Dielectrics

TL;DR: In this paper, the gate tristack dielectric structure can increase the gate capacitance, effectively improve interface properties of both the gate/dielectric and active channels, suppress the charge trap density, and reduce the gate leakage.
Journal ArticleDOI

Self-Rechargeable Paper Thin-Film Batteries: Performance and Applications

TL;DR: In this article, the use of cellulose paper simultaneously as electrolyte, separation of electrodes, and physical support of a rechargeable battery is described, with an output voltage of 0.70 V and a current density that varies between 150 nA/cm2 and 0.5 mA/m2 subject to the paper composition, thickness and the degree of OHx species adsorbed in the paper matrix.
Journal ArticleDOI

Ink-Jet-Printed Zinc–Tin–Oxide Thin-Film Transistors and Circuits With Rapid Thermal Annealing Process

TL;DR: In this paper, high performance ink-jet-printed amorphous zinc-tin-oxide (a-ZTO) thin-film transistors (TFTs) and simple inverter circuits were reported.
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Characteristics of gravure printed InGaZnO thin films as an active channel layer in thin film transistors

TL;DR: In this article, the authors studied the properties of oxide semiconductor thin film transistor prepared by gravure printing technique, which had inverted staggered structure of glass substrate/MoW/SiN x / printed active layer.
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Nonvolatile-Memory Characteristics of $\hbox{AlO}^{-}$ -Implanted $\hbox{Al}_{2}\hbox{O}_{3}$

TL;DR: In this paper, the authors reported the existence of two dominant trap levels, located at around 2 and 4 eV below the conduction band minimum of Al2O3, and showed that these levels are likely attributed to the defects in the AlO divacancy.
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