scispace - formally typeset
Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

read more

Citations
More filters
Journal ArticleDOI

A review of Ga2O3 materials, processing, and devices

TL;DR: The role of defects and impurities on the transport and optical properties of bulk, epitaxial, and nanostructures material, the difficulty in p-type doping, and the development of processing techniques like etching, contact formation, dielectrics for gate formation, and passivation are discussed in this article.
Journal ArticleDOI

Metal oxides for optoelectronic applications

TL;DR: This Review surveys the uniqueness and universality of MOs versus other unconventional electronic materials in terms of materials chemistry and physics, electronic characteristics, thin-film fabrication strategies and selected applications in thin- film transistors, solar cells, diodes and memories.
Journal ArticleDOI

Solution Combustion Synthesis of Nanoscale Materials

TL;DR: This Review focuses on the analysis of new approaches and results in the field of solution combustion synthesis (SCS) obtained during recent years, emphasizing the chemical mechanisms that are responsible for rapid self-sustained combustion reactions.
Journal ArticleDOI

Recent Progress in Materials and Devices toward Printable and Flexible Sensors

TL;DR: In this review, recent progress in materials and devices for future wearable sensor technologies for bio and medical applications are reported.
Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

TL;DR: In this article, the recent progress in n-and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p type, and the major milestones already achieved with this emerging and very promising technology are summarized.
References
More filters
Journal ArticleDOI

Thin Film Transistor of ZnO Fabricated by Chemical Solution Deposition

TL;DR: In this article, a ZnO thin film was deposited on a Si wafer having an oxidized SiO2 layer using a chemical solution deposition process and was applied to a bottom-gate type thin film transistor (TFT).
Journal ArticleDOI

Microstructural, Optical, and Electrical Properties of SnO Thin Films Prepared on Quartz via a Two-Step Method

TL;DR: A simple, cost-effective, two-step method was proposed for preparing single-phase SnO polycrystalline thin films on quartz and it was demonstrated that the average transmittance of both the as-deposited and the annealed SnO thin films was up to 70%.
Journal ArticleDOI

Low-Temperature-Grown Transition Metal Oxide Based Storage Materials and Oxide Transistors for High-Density Non-volatile Memory

TL;DR: In this paper, an effective stacked memory concept utilizing all-oxide-based device components for future high-density nonvolatile stacked structure data storage is developed, where GaInZnO (GIZO) thin-film transistors, grown at room temperature, are integrated with one-diode (CuO/InXnO) and one-resistor (NiO) (1D-1R) structure oxide storage node elements.
Journal ArticleDOI

Role of order and disorder on the electronic performances of oxide semiconductor thin film transistors

TL;DR: In this article, the role of order and disorder on the electronic performances of n-type ionic oxides such as zinc oxide, gallium zinc oxide and indium zinc oxides used as active (channel) or passive (drain/source) layers in thin film transistors (TFTs) processed at room temperature is discussed, taking as reference the known behavior observed in conventional covalent semiconductors such as silicon.
Journal ArticleDOI

Electrical and Photosensitive Characteristics of a-IGZO TFTs Related to Oxygen Vacancy

TL;DR: In this paper, the photoreaction properties of amorphous indium-gallium-zincoxide (a-IGZO) thin-film transistors related to the oxygen vacancies VO are discussed.
Related Papers (5)