O
Oliver Ambacher
Researcher at Fraunhofer Society
Publications - 862
Citations - 29006
Oliver Ambacher is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Amplifier & Monolithic microwave integrated circuit. The author has an hindex of 64, co-authored 848 publications receiving 26256 citations. Previous affiliations of Oliver Ambacher include Osram & Siemens.
Papers
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Proceedings ArticleDOI
Slew rate control of a 600 V 55 mΩ GaN cascode
Achim Endruschat,Thomas Heckel,Richard Reiner,Patrick Waltereit,Rudiger Quay,Oliver Ambacher,Martin Marz,Bernd Eckardt,Lothar Frey +8 more
TL;DR: In this paper, a 600 V, 55 mS GaN cascode with slew rate control is presented, and the time constants of cascodes which determine the switching speed are analyzed, discussed and verified by time domain simulations.
Proceedings ArticleDOI
Ultra-High-Speed Transmitter and Receiver ICs for 100 Gbit/s Ethernet Using InP DHBTs
R. E. Makon,Rachid Driad,J. Rosenzweig,Volker Hurm,C. Schubert,H. Walcher,Michael Schlechtweg,Oliver Ambacher +7 more
TL;DR: In this article, the InP double-heterojunction bipolar transistor (DHBT) based integrated circuit (IC) was developed for 100 Gbit/s class mixed-signal ICs.
Journal ArticleDOI
Excitons and exciton‐phonon coupling in the optical response of GaN
TL;DR: In this paper, reflectance and spectroscopic ellipsometry measurements of high-purity c-plane epitaxial films of wurtzite GaN in a temperature range 5-840 K were carried out.
Proceedings ArticleDOI
Cryogenic low noise amplifier development for 67–116 GHz
Mikko Kotiranta,D. Bruch,Arnulf Leuther,Hermann Massler,Matthias Seelmann-Eggebert,Michael Schlechtweg,Oliver Ambacher,Sener Turk,Jens Goliasch,F. Schafer +9 more
TL;DR: In this paper, two monolithic microwave integrated circuit low noise amplifiers for 67-116 GHz were developed using the 50 nm metamorphic high electron mobility transistor technology of Fraunhofer IAF.
Proceedings ArticleDOI
Highly Scalable Distributed High Electron Mobility Transistor Model
TL;DR: In this paper, a scalable small-signal modeling approach for III-V high electron mobility transistors is presented, which utilizes a distributed six port description of the three transistor electrodes which improves the model validity up to very long finger lengths.