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Oliver Ambacher

Researcher at Fraunhofer Society

Publications -  862
Citations -  29006

Oliver Ambacher is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Amplifier & Monolithic microwave integrated circuit. The author has an hindex of 64, co-authored 848 publications receiving 26256 citations. Previous affiliations of Oliver Ambacher include Osram & Siemens.

Papers
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Two-dimensional electron gases in Ga-face and N-face AlGaN/GaN heterostructures grown by plasma-induced molecular beam epitaxy and metalorganic chemical vapor deposition on sapphire

TL;DR: In this paper, the growth of nominally undoped GaN/AlxGa1−xN/GaN (x < 0.4) high mobility heterostructures with N-face or Ga-face polarity on sapphire substrates by plasma-induced molecular beam epitaxy (PIMBE) and metalorganic chemical vapor deposition was studied.
Patent

Method of separating two layers of material from one another and electronic components produced using this process

TL;DR: In this paper, a method of separating two layers of material from one another in such a way that the two separated layers are essentially fully preserved is proposed. But the method is not suitable for the case where the electromagnetic radiation is absorbed at the interface or in the region in the vicinity of the interface and the absorbed radiation energy induces a decomposition of material at the interfaces.
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Role of Spontaneous and Piezoelectric Polarization Induced Effects in Group-III Nitride Based Heterostructures and Devices

TL;DR: In this paper, the authors present theoretical and experimental results demonstrating how polarization induced electric fields and bound interface charges in group-III nitrides can lead to the formation of two-dimensional carrier gases suitable for the fabrication of high power microwave frequency transistors.
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Electronics and sensors based on pyroelectric AlGaN/GaN heterostructures – Part B: Sensor applications

TL;DR: In this paper, the piezoresistive effect in piezoelectric AlGaN layers is investigated and the dependence of the gauge factor on the Al content is attributed to the influence of strain induced piezOElectric fields.
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Group-III-Nitride Based Gas Sensing Devices

TL;DR: In this article, the performance of a number of relevant exhaust gas components (H 2, HC, CO, NO) was tested with the test gas concentrations and the composition of background gases were chosen to simulate exhaust gas emissions from lean-burn engines.