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Oliver Ambacher

Researcher at Fraunhofer Society

Publications -  862
Citations -  29006

Oliver Ambacher is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Amplifier & Monolithic microwave integrated circuit. The author has an hindex of 64, co-authored 848 publications receiving 26256 citations. Previous affiliations of Oliver Ambacher include Osram & Siemens.

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Journal ArticleDOI

Clusters in a Silane Glow Discharge: Mechanism of Their Formation and How to Avoid Them

TL;DR: The formation of clusters in glow discharge plasma processing is of great concern with respect to the production yield as discussed by the authors, but little is known about the mechanism of their formation and growth and how to avoid them in intense discharges used for high rate deposition of amorphous silicon.
Proceedings ArticleDOI

A Monolithic Integrated mHEMT Chipset for High-Resolution Submillimeter-Wave Radar Applications

TL;DR: In this paper, a millimeter-wave monolithic integrated circuit (MMIC) was developed for use in a high-resolution radar system operating at 300 GHz, which achieved an instantaneous bandwidth of 40 GHz together with an outstanding range resolution of 3.7 mm.

Origin of n-type conductivity in nominally undoped InN

TL;DR: In this article, the influence of different contributions to the high electron concentration in state-of-the-art InN layers grown by molecular-beam epitaxy is investigated, and it is shown that surface accumulation has a crucial influence for thin InN-Schichten 10 μm.
Proceedings ArticleDOI

Gas Pressure Sensing Based on MEMS Resonators

TL;DR: In this paper, the authors used a permanent magnetic field of about 0.5 T by the Lorentz force to measure the resonant response in the frequency domain and found that the quality factor shows a high sensitivity on pressure.
Proceedings ArticleDOI

Novel destructive-interference-envelope detector for high data rate ASK demodulation in wireless communication receivers

TL;DR: The proposed topology targets the theoretical limitation of the maximum achievable data rate or base band bandwidth with respect to the carrier frequency of standard envelope detector approaches and is named destructiveinterference- envelope detector (DIED).