O
Oliver Ambacher
Researcher at Fraunhofer Society
Publications - 862
Citations - 29006
Oliver Ambacher is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Amplifier & Monolithic microwave integrated circuit. The author has an hindex of 64, co-authored 848 publications receiving 26256 citations. Previous affiliations of Oliver Ambacher include Osram & Siemens.
Papers
More filters
Journal ArticleDOI
Generation–recombination noise of DX centers in AlN:Si
S. T. B. Goennenwein,R. Zeisel,Oliver Ambacher,Martin S. Brandt,Martin Stutzmann,Silvia Baldovino +5 more
TL;DR: In this article, both the magnitude and the characteristic frequency of the generation-recombination noise power density in Si-doped aluminum nitride (AlN:Si) were found to be thermally activated.
Journal ArticleDOI
MOVPE of GaInN heterostructures and quantum wells
TL;DR: In this article, the authors have grown GaInN heterostructures and quantum wells by low-pressure metalorganic vapour-phase epitaxy and analyzed the results by X-ray diffraction, optical spectroscopy and atomic force microscopy.
Proceedings ArticleDOI
Continuous-ClassF3 power amplifier mode varying simultaneously first 3 harmonic impedances
V. Carrubba,Rudiger Quay,Michael Schlechtweg,Oliver Ambacher,M. Akmal,Jonathan Lees,Johannes Benedikt,Paul J. Tasker,Steve C. Cripps +8 more
TL;DR: In this paper, the authors presented the first time the broadband continuous-class F3 mode power amplifier (PA) extended to include a variable reactance third harmonic impedance and demonstrated that the different reactive impedance solutions carried out at the single frequency can then be translated into frequency domain, allowing the design of high power-efficiency broadband power amplifiers.
Journal ArticleDOI
Yellow Luminescence and Hydrocarbon Contamination in MOVPE‐Grown GaN
TL;DR: In this article, the origin of the yellow luminescence (YL) in GaN films was investigated as a function of deposition temperature between 650 and 1100 °C, in relation with the microstructure and the contamination in carbon, oxygen, and hydrogen determined by thermal effusion measurements.
Journal ArticleDOI
Impact of Al content on transport properties of two-dimensional electron gas in GaN/AlxGa1−xN/GaN heterostructures
Vladimir Polyakov,V. Cimalla,Vadim Lebedev,Klaus Köhler,Stefan Müller,Patrick Waltereit,Oliver Ambacher +6 more
TL;DR: In this paper, the influence of the Al content on the mobility of the two-dimensional electron gas (2DEG) in GaN/AlxGa1−xN/GaN heterostructures was studied by employing the ensemble Monte Carlo method.