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Journal ArticleDOI

Solid solubilities of impurity elements in germanium and silicon

F. A. Trumbore
- 01 Jan 1960 - 
- Vol. 39, Iss: 1, pp 205-233
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TLDR
In this paper, the available data on solid solubilities of impurity elements in germanium and silicon are summarized in the form of solidus or solvus curves.
Abstract
The available data on solid solubilities of impurity elements in germanium and silicon are summarized in the form of solidus or solvus curves. New solubility data are presented for the lead-germanium, zinc-germanium, indium-germanium, antimony-silicon, gallium-silicon and aluminum-silicon systems. The correlation of the solid solubilities with the heats of sublimation and the atom sizes of the impurity elements is considered.

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Book ChapterDOI

Doping and conductivity in widegap II-VI compounds

G. F. Neumark
TL;DR: The achievement of good bipolar conductivity in widegap semiconductors has been an elusive aim of research for many years as mentioned in this paper, and an extensive review on II-VI compounds and their general properties has been presented by Hartmann et al. in 1982.
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Comparison of solubility limits and electrical activities for antimony and arsenic ion implanted silicon

TL;DR: Ion channeling and electrical measurements have been employed to determine the solubility limits and electrical activities for antimony and arsenic ion implanted silicon following a variety of annealing schedules.
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Über die zeitliche stabilität von getempertem, reinem silizium

B. Viktora
TL;DR: In this paper, an beiden Gruppen ganzlich unterschiedliche Eigenschaften gefunden gegluhten Probestucke were untersucht.
Book ChapterDOI

Resistivity fluctuations in highly compensated ntd silicon

TL;DR: In this article, the resistivity fluctuation Δρ/\(\overline \rho) as a function of compensation ratio in NTD-Si is presented which are valid near exact compensation.
Journal ArticleDOI

Structural evolution of implanted vicinal Si(111) during annealing via analysis of the dipole contribution

TL;DR: In this paper, the amplitude and orientation of the dipole at the surface layer of implanted vicinal Si(111) showed the evolution of its restructuring, and the different electronegativities between Si and participated P atoms changed the dipolar configuration of Si surface.
References
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Journal ArticleDOI

Electrical Properties of Pure Silicon and Silicon Alloys Containing Boron and Phosphorus

TL;DR: In this paper, it was shown that at high temperatures, the electron and hole mobilities of pure silicon alloys are independent of temperature, and at lower temperatures scattering by both ionized and neutral impurity centers contribute, and the mobility is largest for the more pure samples.
Journal ArticleDOI

Chemical interactions among defects in germanium and silicon

TL;DR: In this article, the authors present a blend of theory and experiment, and describe developments in this field during the past few years, including acid-base neutralization, complex ion formation, and ion pairing.
Journal ArticleDOI

Properties of Gold-Doped Silicon

TL;DR: In this article, the acceptor level is measured in $p$-type silicon as 0.62 ev from the valence band, giving a value of band gap consistent with previous measurements by other methods.
Journal ArticleDOI

Über Zweistoffsysteme mit Germanium. I. Germanium/Aluminium, Germanium/Zinn und Germanium/Silicium

TL;DR: In this paper, die Untersuchung von Systemen, die Halbmetalle enthalten, f¨r die Aufklarung feinerer Affinitatswirkungen von Bedeutung ist.
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