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Digital Systems Testing and Testable Design
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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
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Proceedings ArticleDOI
ATPG for heat dissipation minimization during scan testing
TL;DR: An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan and an ATPG that maximizes the number of state input values, which are assigned don't care values, has been developed.
Journal ArticleDOI
Generation of design verification tests from behavioral VHDL programs using path enumeration and constraint programming
Ranga Vemuri,R. Kalyanaraman +1 more
TL;DR: A method for generation of design verification tests from behavior-level VHDL programs is presented, based on path enumeration, constraint generation and constraint solving techniques that have been traditionally used for software testing.
Proceedings ArticleDOI
Data compression for multiple scan chains using dictionaries with corrections
TL;DR: A new dictionary based compression scheme is proposed which allows a fully regular test application while keeping the storage requirements low, and the advantages of a multiple-scan architecture are preserved, and very low test times can be achieved.
Proceedings ArticleDOI
Full fault dictionary storage based on labeled tree encoding
TL;DR: Eight alternative representations based on the three label components are presented and two existing full fault dictionary representations (the matrix and the list dictionaries) are shown to be special cases in the general framework.
Proceedings ArticleDOI
A deductive technique for diagnosis of bridging faults
TL;DR: A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is applicable to combinational or full-scan sequential circuits.