Open AccessBook
Digital Systems Testing and Testable Design
TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
Citations
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Journal ArticleDOI
On the generation of test patterns for multiple faults
TL;DR: A new method to generate test patterns for multiple stuck-at faults in combinational circuits using similar techniques to those in FAN and SOCRATES algorithms to guide the search part of the algorithm, and includes several new heuristics to enhance the performance and fault detection capability.
Application Area Specific System Level Fault Models: A Case Study with a Simple NoC Switch
TL;DR: It is argued that it is practical and efficient to define application area specific system level fault models to handle the growing size and complexity of testing of digital systems.
Patent
Method for identifying untestable and redundant faults in sequential logic circuits.
TL;DR: In this article, a lead in a circuit is selected and the circuit is analyzed to determine which faults would be hypothetically undetectable at a given time frame if the selected circuit lead were unable to assume a logic 0 at a starting time frame, and which faults could not be detected at the same time frame in both hypothetical cases.
Journal ArticleDOI
Assignment and allocation of highly testable data paths under scan optimization
TL;DR: The synthesis of highly testable data paths under scan optimization from a given scheduled data flow graph is addressed, using an intelligent register allocation technique to minimize the number of sequential loops.
Proceedings ArticleDOI
Comparative study of CA with phase shifters and GLFSRs
TL;DR: Experimental results for different degrees show that GLFSRs are preferable in both hardware cost and fault Coverage, and compare CA with phase shifters (CAPSs) andGLFSRs without phase shifter in terms of the minimum inter-channel separation that they achieve and the overall XOR cost for each construction.