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Digital Systems Testing and Testable Design

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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.
Abstract
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.

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Proceedings ArticleDOI

An overview of fault models and testing approaches for reversible logic

TL;DR: An overview of the various fault models and testing approaches for reversible logic is provided, as well as highlighting important results and comparisons/connections between the various models.
Journal ArticleDOI

TAIR: testability analysis by implication reasoning

TL;DR: The algorithm starts with results obtained from conventional testability analysis such as COP and gradually refine these results by recursively applying some simple signal correlation rules, and shows that, with reasonable run-time overhead, significant improvement fortestability analysis can be achieved.
Patent

3D semiconductor device and structure with back-bias

TL;DR: In this paper, a 3D semiconductor device including a first layer including first transistors, a second layer including second transistors and at least one transistor has a back bias structure designed to modify the performance of the second transistor.
Journal ArticleDOI

A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects

TL;DR: A comprehensive framework for logic diagnosis consisting of two main phases, able to deal with several fault models at the same time, and able to handle both single and multiple fault occurrences.
Proceedings ArticleDOI

Diversity techniques for concurrent error detection

TL;DR: A quantitative comparison of the effectiveness different CED schemes is presented, and design techniques for efficient concurrent error detection techniques are developed.