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Digital Systems Testing and Testable Design
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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
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Journal ArticleDOI
On the design of optimal counter-based schemes for test set embedding
Dimitri Kagaris,S. Tragoudas +1 more
TL;DR: Fast synthesis techniques are presented that result in almost optimal designs for built-in test set embedding and efficiently determine whether counter-based schemes are applicable as built- in generators for a given circuit.
Proceedings ArticleDOI
On per-test fault diagnosis using the X-fault model
Xiaoqing Wen,Tokiharu Miyoshi,Seiji Kajihara,Laung-Terng Wang,Kewal K. Saluja,Kozo Kinoshita +5 more
TL;DR: In this paper, a per-test fault diagnosis method based on the X-fault model was proposed, which represents all possible behaviors of a physical defect or defects in a gate and/or on its fanout branches.
Journal ArticleDOI
FILL and FUNI: algorithms to identify illegal states and sequentially untestable faults
TL;DR: An algorithm (FILL) is presented to efficiently identify a large subset of illegal states in synchronous sequential circuits, without assuming a global reset mechanism, and FUNI is a direct method that identifies untestable faults without using the exhaustive search involved in automatic test generation (ATG).
Journal ArticleDOI
Sequential fault modeling and test pattern generation for CMOS iterative logic arrays
TL;DR: A comprehensive, cell-level, sequential fault model suitable for ILAs, termed Realistic Sequential Cell Fault Model (RS-CFM) is introduced, which drastically reduces test complexity compared to exhaustive two-pattern testing proposed so far in the literature for sequential ILA testing, without sacrificing test quality.
Book ChapterDOI
Evolutionary algorithms for the physical design of VLSI circuits
TL;DR: This work reviews evolutionary algorithms for physical design and observes and analyze the common traits of the superior contributions and discusses important requirements for evolutionary-based approaches for even greater acceptance within the VLSI community.