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Digital Systems Testing and Testable Design
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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
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Journal ArticleDOI
Synthesis of modular mechatronic products: a testability perspective
Chun-Che Huang,Andrew Kusiak +1 more
TL;DR: In this paper, a generalized label-correcting algorithm is developed to determine the points of focus, testability values, and access paths in modular mechatronic products, and the generation of modular products and module testability issues are discussed.
Proceedings ArticleDOI
Eliminating false positives in crosstalk noise analysis
TL;DR: A method to check the "true" noise impact on path delay is proposed, which uses four-variable Boolean logic to characterize signal transitions in a time interval, and formulates Boolean satisfiability between aggressors and a victim under the min-max delay model for gates.
Proceedings ArticleDOI
Ravel: assigned-delay compiled-code logic simulation
Emily Shriver,Karem A. Sakallah +1 more
TL;DR: Initial experiments with Ravel on a subset of the ISCAS 89 sequential benchmarks confirm its viability as an alternative to event-driven simulation.
Journal ArticleDOI
SIVA: A System for Coverage-Directed State Space Search
TL;DR: This work introduces SImulation Verification Verification with Augmentation (SIVA), a tool for coverage-directed state space search on digital hardware designs and presents approaches to automatically generate “lighthouses” that guide the search towards hard-to-reach coverage goals.
Book ChapterDOI
Evolving Cellular Automata for Self-Testing Hardware
TL;DR: Experimental results show that in most of the standard benchmark circuits the Cellular Automaton selected by the Selfish Gene algorithm is able to reach a Fault Coverage higher that what can be obtained with current engineering practice with comparable area occupation.