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Digital Systems Testing and Testable Design

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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.
Abstract
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.

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Journal ArticleDOI

Protection Against Hardware Trojans With Logic Testing: Proposed Solutions and Challenges Ahead

TL;DR: This paper surveys how VLSI testing principles can be adapted to protect ICs against hardware trojans.
Journal ArticleDOI

Behavioral-level synthesis of heterogeneous BISR reconfigurable ASIC's

TL;DR: New heterogeneous BISR methodologies are presented which remove this constraint and enable replacement of a module with a spare of a different type, based on the flexibility of behavioral-level synthesis to explore the design space.
Book ChapterDOI

Fault-oriented Test Generation for Multicast Routing Protocol Design

TL;DR: This study unveils several robustness violations in PIM-DM, for which fixes are suggested with the aid of the presented algorithm.
Proceedings ArticleDOI

Static test compaction for delay fault test sets consisting of broadside and skewed-load tests

TL;DR: Experimental results demonstrate that the procedure is able to reduce the sizes of available mixed test sets significantly and modifies the types of significant numbers of tests before including them in the compacted test set.
Proceedings ArticleDOI

Improved volume diagnosis throughput using dynamic design partitioning

TL;DR: A new failure dependent design partitioning method is proposed to improve volume diagnosis throughput with a minimal impact on diagnosis quality to increase the throughput of volume diagnosis by increasing the number of failing dies diagnosed within a given time.