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Digital Systems Testing and Testable Design
TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
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Proceedings ArticleDOI
Register-transfer level fault modeling and test evaluation techniques for VLSI circuits
TL;DR: In this paper, the authors proposed a fault sampling approach to estimate the gate-level fault coverage of given test patterns, such that the RTL fault list of a module can be treated as a representative fault sample of the collapsed stuck-at fault set of the module.
Journal ArticleDOI
Software-based self-testing of microprocessors
TL;DR: In this article, the authors investigate capabilities of the microprocessor testing by software procedures taking into account system environment constraints, and propose new test strategies combining deterministic and pseudo-random approaches supported by the available hardware mechanisms, which improve testability features.
Journal ArticleDOI
A new class of sequential circuits with combinational test generation complexity
TL;DR: A new class of sequential circuits with combinational test generation complexity which is introduced which is called internally balanced structures and shows the effectiveness of this approach to design for testability based on the partial scan and to test generation time reduction for sequential circuits in general, using characteristics of the internal balanced structures.
Proceedings ArticleDOI
Diagnostic and Detection Fault Collapsing for Multiple Output Circuits
TL;DR: In this article, a novel algorithm based on redundancy identification has been proposed to find the equivalence and dominance collapsed sets based on diagnostic and detection collapsing for multiple output combinational circuits.
Proceedings ArticleDOI
Diagnostic fault equivalence identification using redundancy information and structural analysis
TL;DR: Fault pair distance analysis is introduced in this paper to characterize diagnostically equivalent fault pairs and motivate local circuit transformations and structural analysis to identify equivalences in combinational circuits rapidly.