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Digital Systems Testing and Testable Design

TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.
Abstract
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.

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Patent

Semiconductor device and structure

TL;DR: In this paper, a first layer and a second layer of layer-transferred mono-crystallized silicon, where the first layer comprises a first plurality of horizontally-oriented transistors, and the second layer includes a second plurality of vertically oriented transistors.
Patent

Method for fabrication of a semiconductor device and structure

TL;DR: In this article, a method to process an Integrated Circuit device including processing a first layer of first transistors, then processing a metal layer overlaying the first layer and providing at least one connection to the first Transistors, and finally processing a second layer of second transistors overlaying a first metal layer, wherein the second metal layer is connected to provide power to at least 1 of the second Transistors.
Journal ArticleDOI

Approximating Minimum Feedback Sets and Multicuts in Directed Graphs

TL;DR: A combinatorial algorithm that computes a (1+ɛ) approximation to the fractional optimal feedback vertex set, and a generalization of these problems, in which the feedback set has to intersect only a subset of the directed cycles in the graph.
Patent

Block based design methodology

TL;DR: In this article, the authors present a method and apparatus for designing a circuit system, including selecting a plurality of pre-designed circuit blocks to be used to design the circuit system and, upon acceptance, forming block specifications for deploying the circuit blocks on a floor plan of a chip, as a system on a chip.

A Practical Tutorial on Modified Condition/Decision Coverage

TL;DR: This tutorial provides a practical approach to assessing modified condition/decision coverage (MC/DC) for aviation software products that must comply with regulatory guidance for DO-178B level A software.