STMicroelectronics

About: STMicroelectronics is a company organization based out in Geneva, Switzerland. It is known for research contribution in the topics: Signal & Transistor. The organization has 17172 authors who have published 29543 publications receiving 300766 citations. The organization is also known as: SGS-Thomson & STM.

Transaction-level models for AMBA bus architecture using SystemC 2.0 [SOC applications]

Abstract: The concept of a SOC platform architecture introduces the concept of a communication infrastructure. In the transaction-level, a finite set of architecture components (memories, arithmetic units, address generators, caches, etc) communicate among each other over shared resources (buses). Until recently, modeling architectures required pin-level hardware descriptions, typically coded in RTL. Great effort is required to design and verify the models, and simulation at this level of detail is tediously slow. Transaction level modeling is the solution. Transaction level models (TLMs) effectively create an executable platform model that simulates orders of magnitude faster than a RTL model.

Energy-Efficient Near-Threshold Parallel Computing: The PULPv2 Cluster

Abstract: This article presents an ultra-low-power parallel computing platform and its system-on-chip (SoC) embodiment, targeting a wide range of emerging near-sensor processing tasks for Internet of Things (IoT) applications. The proposed SoC achieves 193 million operations per second (MOPS) per mW at 162 MOPS (32 bits), improving the first-generation Parallel Ultra-Low-Power (PULP) architecture by 6.4 and 3.2 times in performance and energy efficiency, respectively.

Resolution Estimation of the Au, Ag, Cu, and Al Single- and Double-Layer Surface Plasmon Sensors in the Ultraviolet, Visible, and Infrared Regions

Abstract: Figures of merit are introduced for estimation of achievable resolution of surface plasmon (SP) sensors by modulation type. The resolution of SP sensors in the Kretschmann’s geometry is estimated by numerical simulation for combinations of silver (Ag), copper (Cu), aluminum (Al), chromium, and titanium layers with a gold (Au) layer in the ultraviolet (UV), visible, and infrared (IR) regions in cases of detecting the change of the refractive index of water and the presence of an adsorption layer in water. SP biosensors with angular modulation based on Al exhibit low resolution in the UV region; Ag, Au, and Cu biosensors show best resolution in the visible region. Biosensors with intensity modulation demonstrate high performance in the near IR by Ag, Au, and Cu metals, and in the UV by Al.

Microelectromechanical gyroscope with rotary driving motion and improved electrical properties

Abstract: An integrated microelectromechanical structure is provided with: a die, having a substrate and a frame, defining inside it a detection region and having a first side extending along a first axis; a driving mass, anchored to the substrate, set in the detection region, and designed to be rotated in a plane with a movement of actuation about a vertical axis; and a first pair and a second pair of first sensing masses, suspended inside the driving mass via elastic supporting elements so as to be fixed with respect thereto in the movement of actuation and so as to perform a detection movement of rotation out of the plane in response to a first angular velocity; wherein the first sensing masses of the first pair and the first sensing masses of the second pair are aligned in respective directions, having non-zero inclinations of opposite sign with respect to the first axis.

Security locks for integrated circuit

Abstract: The disclosure relates to integrated circuits and, more particularly, to circuits that use electronic locks to modify the configuration of the circuit, for example to restrict access by the user to certain functions or certain pieces of data of the circuit. There is provision for a first electronic lock capable of being locked or unlocked during a stage for the testing of the integrated circuit and capable of being irreversibly locked after the end of the testing stage, and for a second electronic lock capable of being unlocked only so long as the first lock is unlocked. In this way, the entire circuit can be tested in the form in which it is presented to the user, the locking of the locks being, so to speak, simulated during the test.